Method for detecting probe wear and probe
A technology for detecting probes and probes, applied to measuring devices, instruments, etc., can solve the problems of reduced test energy, long time consumption, difficulty in judging sticky dirt, etc., and achieves the effect of not easy to misjudge
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0034] In order to further explain the technical means and effects of the present invention to achieve the intended purpose of the invention, the method for detecting probe wear according to the present invention and the specific implementation methods and methods of the probe will be described below in conjunction with the accompanying drawings and preferred embodiments. , step, structure, feature and effect thereof, detailed description is as follows.
[0035] Some embodiments of the invention are described in detail below. However, the invention can be broadly practiced in other embodiments than this detailed description. That is to say, the scope of the present invention is not limited by the proposed embodiments, but is subject to the patent scope of the present invention. Secondly, when each element or structure in the illustrations of the embodiments of the present invention is described as a single element or structure, it should not be regarded as a limited cognition...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com