Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Test backboard, backboard-based loading method and backboard-based testing method

A technology for testing backplanes and test boards, which is applied in software testing/debugging, measuring electronics, and measuring devices. It can solve problems such as downloading and batching of single-board programs, so as to speed up research and development, improve practicability and scalability, The effect of improving test efficiency and quality

Inactive Publication Date: 2009-12-02
董艳
View PDF0 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] This test method has the following disadvantages: 1. Can not carry out batch veneer program download, only one by one veneer download or sintering; 2. Can not carry out JTAG test of batch veneer

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test backboard, backboard-based loading method and backboard-based testing method
  • Test backboard, backboard-based loading method and backboard-based testing method
  • Test backboard, backboard-based loading method and backboard-based testing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] The specific implementation manners of the present invention will be described in detail below in conjunction with the accompanying drawings. Aiming at the defects of the traditional single-board testing method, the present invention provides a multi-purpose communication product testing backboard, a single-board program batch downloading method and a batch single-board JTAG testing method based on the testing backboard. Using this test backplane to test a single board requires relatively few resources, and the test can be performed without the assistance of some key single boards, and some special function tests of the single board can be performed.

[0027] A test backplane comprising:

[0028] The main control board slot is used to transmit the signal between the test backplane and the main control board;

[0029] At least one cross-connect board slot for transmitting signals between the test backplane and the cross-connect board;

[0030] At least one business sin...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a test backboard, a backboard-based loading method and a backboard-based testing method. The backboard comprises a main control board slot position which is used for transmitting signals between the test backboard and a main control board; at least one cross board slot position which is used for transmitting signals between the test backboard and a cross board; at least one service single board slot position which is used for transmitting signals between the test backboard and a service single board; an expansion slot position which is used for transmitting signals between the test backboard and an expansion slot position test board; and a switch electric device which is used for controlling power up and down of the slot positions. The technical proposal provided by the invention integrates the main control board slot position, the cross board slot position, the service single board slot position and the expansion slot position in the test backboard and supports the tests of specific functions of the single board such as single board program batch downloading and batch single board JTAG test besides tests of the normal functions and performance of the single board.

Description

technical field [0001] The present invention relates to a test backboard, a downloading method and a testing method based on the backboard, in particular to a communication product test backboard, a method for batch downloading single-board programs based on the test backboard, and a batch single-board joint test action group (Joint Test Action) Group, JTAG) standard test method. Background technique [0002] Communication products need to be tested during the research and development process to verify whether the equipment is normal. A device of communication products is often composed of multiple boards, so the test of a single board becomes the first level of equipment testing. The test of the single board mainly uses the communication interface between the single board and the backplane to input relevant control signals and service signals to the single board, then sends the feedback signal through the communication interface between the single board and the backplane, ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01R13/641H01R13/70G01R31/3185G06F11/36
Inventor 何剑锋侯明鑫王志鹏魏雪晔程兵旺
Owner 董艳
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com