Detection method and apparatus for memory capacity

Abstract

The invention, which is suitable for the field of memories, provides a method for detecting the capacity of memories, a method thereof, and a storage controller. The method comprises the following steps: the capacity of the storage controller is configured; different data are written in various pre-selected objective addresses, N objective addresses among the objective addresses correspond to the same actual address of the memories, and the numbers of N are also different in the memories with different capacities; the data is read from the different objective addresses; and the capacities of the memories to be detected are detected based on whether the data read from the different objective addresses is equal to those written in multiple different objective addresses or not. The embodiment of the invention only needs to determine whether the written different objective addresses are equal to the data which is red from the different objective addresses or not, the capacities of the memories to be detected can be detected, thereby improving the detection speed and the detecting efficiency of the capacities of the memories; meanwhile, the method utilizes the internal row and column structures of the memories with different capacities to perform the detection of the capacities, thereby facilitating the implantation. The invention is suitable for various different application situations.

Description

technical field [0001] The invention belongs to the field of memory, and in particular relates to a memory capacity detection method and device. Background technique [0002] In order to better access external memories, such as synchronous dynamic random access memory (Synchronous DRAM, SDRAM), static random access memory (Static RAM, SRAM), etc., it is necessary to detect the capacity of the external memory in advance. [0003] The prior art provides a variety of memory capacity detection methods, such as by adding 2 to the memory to be tested N+1 Write data in the address, and then read from 2 of the memory to be tested N+1 Read data in the address, and compare the read data with the data in address 0, if they are the same, the capacity of the memory to be tested is 2N. This memory capacity detection method can quickly detect the capacity of a static random access memory (Static RAM, SRAM). [0004] Since the internal structure of SDRAM is different from that of SRAM, t...

AI Technical Summary

Problems solved by technology

Because the traversal method needs to traverse the entire memory address space to detect the memory capacity, as the memory capacity increases, the time spent on memory capacity detection will increase, so it is not suitable for system startup time requirements. higher embedded applications

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