Multi-purpose ultrafast electric diffraction apparatus
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An electron diffraction, multi-purpose technology, applied in the direction of material analysis using radiation diffraction, etc., can solve the problems that the electron energy cannot be adjusted, the ultrafast electron diffraction device cannot adapt to solid-phase, vapor-phase electron diffraction experiments, and electric field distortion at the same time. Achieve the effect of improving time\space resolution
Inactive Publication Date: 2009-05-20
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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[0013] The purpose of the present invention is to provide a multi-purpose ultrafast electron diffraction device, which solves the problem that the existing ultrafast electron diffraction device cannot adapt to the electron diffraction experiments of solid phase and vapor phase at the same time, and the electron energy cannot be adjusted. The technical problem that the electric field is seriously distorted and the photocathode may fail
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[0034] The multi-purpose ultrafast electron diffraction device of the present invention includes a laser light source, an electron gun 20 capable of generating ultrafast electron beams, a sample chamber, an electron diffraction image detector and a vacuum pumping system. The laser light source enters the electron gun 20 from the input window 1, and the electron gun 20 An electron gun vacuum system 4 and a vacuum measuring gauge 3 are connected on the top, a cathode 22 and an anode 24 are arranged in the electron gun 20, a gold film is plated on the cathode 22, an anode hole 25 is arranged in the center of the anode 24, and the anode hole 25 is installed There is a metal grid 18, and the grid size of the metal grid 48 is 15 μm×5 μm; an insulating ring 23 is arranged between the cathode 22 and the anode 24; the outer end of the cathode 22 is provided with a pressure ring 21, which is used to connect the cathode 22. The insulating ring 23 and the anode 24 are tightly pressed in th...
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Abstract
The invention relates to a multipurpose ultrafast electron diffraction device, which comprises a laser source, an electron gun capable of generating ultrafast electron beams, a sample chamber, an electron diffraction image detector and a vacuum pumping system, wherein a cathode and an anode are arranged in the electron gun; the cathode is plated with a metallic film; the center of the anode is provided with an anode keyhole; an insulating ring is arranged between the cathode and the anode; the electron gun and the sample chamber are connected through an electron beam channel; the outer circumference of the electron beam channel is sleeved with a magnetic coil; a joint of the electron beam channel and the sample chamber is provided with an electron beam channel keyhole; the diameter of the electron beam channel keyhole is between phi 1 and phi 2 millimeters; and a vacuum system comprises an electron gun vacuum system connected with the electron gun, as well as a sample chamber vacuum system connected with the sample chamber. The multipurpose ultrafast electron diffraction device provided by the invention solves the problems that the prior ultrafast electron diffraction device can not simultaneously adapt to solid-phase and vapor-phase electron diffraction experiments, can not regulate energy, is serious in the distortion of an electric field near the anode, and is invalid in photocathode.
Description
technical field [0001] The invention relates to an ultrafast electron diffraction device, which is an important experimental device for researching and detecting the state of matter, the phase transition of material transient structure, and the process of material structure change in some chemical or biological reaction processes. Background technique [0002] The ultrafast electron diffraction device mainly includes a laser light source, an electron gun that generates ultrafast electron beams, a sample chamber, an electron diffraction image detector, a vacuum system, etc., and the ultrafast electron gun driven by ultrashort laser pulses is the core of the device. [0003] Foreign scholars have done a lot of research: such as J.Cao, Z.Hao, H.Park, C.Tao, et al; Appl.Phys.Lett., 2003, 83 (5): 1044-1046; Hyotcherl Ihee, Valdimir A. Lobastov, Udo M. Gomez, et al., Science, 2001, 291 (19): 458-462; J. Charles Williamson, J. Cao, Hyotcherl Ihee, et al. Nature, 1997, 386 (13): 15...
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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/20
Inventor 赛小锋赵宝升田进寿王俊锋邹玮
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI