Self-test circuitry to determine minimum operating voltage
A technology for operating voltage and circuits, applied in marginal circuit testing, electronic circuit testing, etc., can solve the problems of reducing clock cycle frequency, reducing power, etc., and achieve the effects of reducing leakage, low leakage, and improving performance
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[0031] Figure 1 is a block diagram of a system 10 in accordance with the present invention. As shown in FIG. 1 , system 10 includes a voltage island under test ("VIUT") block 20 having a voltage supply 25 through a gated transistor 26, shown as Vdd. Test input / output signal lines 30 connect the operating elements of the voltage island circuit with a built-in self-test (BIST) circuit 50 suitable for (logic BIST) LBIST and / or (array BIST) ABIST modes of operation. As will be described in detail with reference to FIG. 2 , BIST performs performance testing of logic and / or memory arrays at application speed and outputs digital control signals 55 , which are input to digital-to-analog converter (DAC) devices 60 . The DAC 60 outputs an analog reference signal 70 which is input to a bandgap reference circuit 75 which generates a reference voltage 80 . The reference voltage 80 is input to a voltage supply stabilizer comprising an operational amplifier device 90 and a transistor device...
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