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Self-test circuitry to determine minimum operating voltage

A technology for operating voltage and circuits, applied in marginal circuit testing, electronic circuit testing, etc., can solve the problems of reducing clock cycle frequency, reducing power, etc., and achieve the effects of reducing leakage, low leakage, and improving performance

Inactive Publication Date: 2008-05-07
INT BUSINESS MASCH CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Previous designs have supported voltage supply scaling to maintain performance, but most designs simply reduce clock cycle frequency to reduce power
Also, different voltage / clock frequency setpoints are not determined on a chip-by-chip basis

Method used

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  • Self-test circuitry to determine minimum operating voltage
  • Self-test circuitry to determine minimum operating voltage
  • Self-test circuitry to determine minimum operating voltage

Examples

Experimental program
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Embodiment Construction

[0031] Figure 1 is a block diagram of a system 10 in accordance with the present invention. As shown in FIG. 1 , system 10 includes a voltage island under test ("VIUT") block 20 having a voltage supply 25 through a gated transistor 26, shown as Vdd. Test input / output signal lines 30 connect the operating elements of the voltage island circuit with a built-in self-test (BIST) circuit 50 suitable for (logic BIST) LBIST and / or (array BIST) ABIST modes of operation. As will be described in detail with reference to FIG. 2 , BIST performs performance testing of logic and / or memory arrays at application speed and outputs digital control signals 55 , which are input to digital-to-analog converter (DAC) devices 60 . The DAC 60 outputs an analog reference signal 70 which is input to a bandgap reference circuit 75 which generates a reference voltage 80 . The reference voltage 80 is input to a voltage supply stabilizer comprising an operational amplifier device 90 and a transistor device...

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PUM

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Abstract

A solution for determining minimum operating voltages due to performance / power requirements would be valid for a wide range of actual uses. The solution includes a test flow methodology for dynamically reducing power consumption under applied conditions while maintaining application performance via a BIST circuit. There is additionally provided a test flow method for dynamically reducing power consumption to the lowest possible stand-by / very low power level under applied conditions that will still be sufficient to maintain data / state information. One possible application would be for controlling the voltage supply to a group of particular circuits on an ASIC (Application Specific Integrated Circuit). These circuits are grouped together in a voltage island where they would receive a voltage supply that can be different from the voltage supply other circuits on the same chip are receiving. The same solution could be applied to a portion of a microprocessor (the cache logic control, for example).

Description

technical field [0001] The present invention relates generally to integrated circuits, and, more particularly, to systems and methods for determining and dynamically changing the minimum operating voltage of an IC. Background technique [0002] Power dissipation is becoming increasingly important to reducing both the power consumed by devices and the heat energy dissipated. A critical portion of power consumption in deep submicron technology is the power caused by leakage currents. Leakage can actually be reduced by reducing the voltage used by the circuit, thereby actually reducing the power consumption of the circuit. [0003] Previous designs have supported voltage supply scaling to maintain performance, but most designs simply reduce clock cycle frequency to reduce power. Also, different voltage / clock frequency set points are not determined on a chip-by-chip basis. [0004] US Patent No. 6,345,362 to Bertin et al. (IBM) teaches integrated circuits with intelligent pow...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/3004
Inventor 瓦格迪·W·阿巴迪尔乔治·M·布雷塞拉斯安东尼·R·博纳西奥凯文·W·戈尔曼
Owner INT BUSINESS MASCH CORP
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