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Test data management system

A management system and test data technology, applied in the direction of electrical digital data processing, special data processing applications, signal transmission systems, etc., can solve the problems of data format and content restrictions, and achieve the effect of increasing formats and methods, and increasing storage channels

Inactive Publication Date: 2008-04-02
SHANGHAI HUAHONG GRACE SEMICON MFG CORP
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The existing test data management system is limited by the single method of the existing system, and the format and content of the data are greatly restricted

Method used

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Embodiment Construction

[0009] As shown in Figure 2, the test data management system of the present invention, in order to solve the above technical problems, the technical solution adopted by the test data management system of the present invention is to include a tester, a probe station connected to the tester, a probe station and The data server for centralized storage and classification management of data is connected and transmitted signals, the analysis server is connected with the data server and the data transmitted by the data server is analyzed, the analysis server and the data server are respectively connected with the host or bus, and others For devices that are directly connected to the host or bus or connected to the host or bus through the server and the host or bus, in the test program, a subroutine that reads the classification of the test result of the test chip and the data such as DC parameters is embedded to obtain the data, including the connection with the tester A data management ...

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Abstract

The invention discloses a testing data management system which comprises a tester, a probe platform, a data server and an analysis server, the analysis server and the data server are respectively connected with a host machine or a bus, the invention also comprises other equipment directly connected with the hot machine or the bus or connected with the host machine or the bus, through the servers; a data management server is arranged and is connected with the analysis server to transfer the signal in double direction. In testing process, the data obtained by the tester can be made into the temporary data document and saved in the host machine of the tester, when the testing process is over, the data document can be uploaded to the data management server from the host machine of the tester, the data management server can be visited and operated, etc. through the analysis server. By increasing the data management server, the invention can increase the formats and methods of the transferred testing data saved and transferred by the system, thereby the system can use the testing data for project analysis, simultaneously, the data saving channel can be increased.

Description

Technical field [0001] The invention relates to an automatic data management system, especially a test data management system. Background technique [0002] As shown in Figure 1, the existing test data management system includes a tester and a probe station connected to the tester. The probe station is connected to a data server for centralized storage and classified management of data and transmits signals and analyzes The server and the data server are connected and the data transmitted by the data server is analyzed. The analysis server and the data server are respectively connected to the host or bus, and also include other devices directly connected to the host or bus or connected through the server and the host or bus , In the test program, a subprogram that reads the classification of the test result of the test chip and the data such as DC parameters is embedded to obtain the data. After the test is over, the data stream of the test data can only be automatically transmit...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/00G06F17/30G08C19/00
Inventor 陈凯华谢晋春陈婷桑浚之辛吉升
Owner SHANGHAI HUAHONG GRACE SEMICON MFG CORP
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