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Fixed point measuring method for x-ray diffraction peak height ratio

A fixed-point measurement and diffraction peak technology, applied in the field of X-ray diffraction peak height ratio measurement, can solve the problems of large counting statistical error, peak height ratio accuracy and repeatability deviation, etc., to achieve good material performance, accuracy and repeatability Improved effect

Inactive Publication Date: 2008-04-02
BEIJING PURKINJE GENERAL INSTR
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Problems solved by technology

The conventional method of determining the peak height ratio is to obtain the intensity of each diffraction peak through continuous scanning. Due to the large statistical error of counting in this method, the accuracy and repeatability of the obtained peak height ratio have large deviations.

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  • Fixed point measuring method for x-ray diffraction peak height ratio

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Embodiment Construction

[0023] The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0024] A fixed-point method for measuring the peak-to-peak ratio of diffraction peaks provided by the present invention is applied to Ni electrode materials. Taking Ni electrode materials as an example, the specific steps of the present invention are as follows:

[0025] 1) The powder sample is pressed into tablets and measured on an X-ray diffractometer, - 2θ scanning range: 15°-90°. Obtain the X-ray diffraction spectrum of the sample, analyze its phase composition, and determine which peak height ratios need to be solved according to its phase composition to characterize the material properties. Referring to Figure 1, it can be seen from the figure that the main phase of this material is Ni(OH) 2 . The 2θ values ​​corresponding to the three diffraction lines of (001), (100), and (101) crystal planes that need to be solved.

[002...

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Abstract

The invention relates to a measuring method of X-ray diffraction peak height ratio and discloses a fixed point measuring method of X-ray diffraction peak height ratio, including the following steps: (1) a powder sample is tableted and measured on an X-ray diffractometer so as to determine that the peak height ratio of which peaks needs to be calculated to represent material characteristic according to the phase composition of the sample; (2) the counting interval for calculating peak height ratio by the fixed point measuring method is optimized; (3) the diffraction peak height ratio result of the sample is obtained by common continuous scanning method; (4) the diffraction peak height ratio result of the sample is obtained through fixed point measuring method; (5) the measured results of the step (3) and the step (4) are compared; (6) sample preparation is completed once again and the diffraction peak height ratio result of the newly prepared sample is measured through fixed point measuring method. The invention greatly increases accuracy and repeatability of X-ray diffraction peak height ratio measurement, thereby people can know better about material characteristic; moreover, the invention provides more accurate basis for presuming cycle life and electricity storage of cell.

Description

technical field [0001] The invention relates to a method for measuring the peak height ratio of X-ray diffraction, in particular to a method for measuring the peak height ratio at a fixed point. Background technique [0002] X-ray diffraction peak height ratio is one of the methods to characterize the performance of crystalline materials. Especially for battery materials, accurate determination of peak height ratio can accurately understand the electrochemical performance of the battery, so as to further infer the cycle life and power reserve of the battery. The conventional method for determining the peak height ratio is to obtain the height intensity of each diffraction peak through continuous scanning. Due to the large counting statistical error in this method, the accuracy and repeatability of the obtained peak height ratio have large deviations. Contents of the invention [0003] (1) Technical problems to be solved [0004] The purpose of the present invention is to ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/207G01N1/28G06F17/00
Inventor 孙宏伟付献程群
Owner BEIJING PURKINJE GENERAL INSTR
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