Plasm restraint device
A plasma and confinement device technology, applied in the field of substrate devices, can solve problems such as processing chamber pollution, achieve the effects of preventing pollution, improving utilization, and preventing secondary discharge
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[0051] As another embodiment of the present invention, the conductive element 100 may also be formed of a conductive semiconductor material doped with impurities, wherein the impurities are various elements or various elements that can make the semiconductor material conductive In combination, preferably, in this embodiment, the conductive element 100 is formed of a silicon semiconductor material doped with boron or nitrogen.
[0052] In the embodiment shown in FIG. 2 and FIG. 3 , the conductive element 100 is formed by a plurality of conductive concentric rings 101 and a conductive support ring 90 , and channels 102 are formed between the conductive concentric rings 101 . As a modification of this embodiment, the conductive element 100 can be an integrally formed conductive plate (not shown), which is arranged around the lower electrode in a substantially ring shape, and is arranged in the processing area and the plasma processing apparatus. Between the exhaust areas, through...
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