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Vision measuring method for projecting multiple frequency grating object surface tri-dimensional profile

A technology of object surface and measurement method, applied in the direction of measuring device, optical device, 3D image processing, etc., can solve the problems of single fringe phase noise, large number of gratings, etc.

Inactive Publication Date: 2008-01-16
北京智启维恩科技开发有限公司
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Problems solved by technology

Since the single-stripe phase contains large noise, when using it as a reference to directly expand the phase of the multi-stripe grating, a large error will occur
There are also some projection schemes using multiple gratings, such as the grating stripe exponentially increasing scheme (f=1, 2, 4, 8, 16, 32, 64, 128), which require a larger number of gratings to be projected

Method used

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  • Vision measuring method for projecting multiple frequency grating object surface tri-dimensional profile
  • Vision measuring method for projecting multiple frequency grating object surface tri-dimensional profile
  • Vision measuring method for projecting multiple frequency grating object surface tri-dimensional profile

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Embodiment Construction

[0068] An embodiment of an optical three-dimensional measurement method and system proposed by the present invention is described as follows:

[0069] The measurement system of this embodiment is shown in Figure 1. The system consists of cameras 1 and 2, a projector 3, and a computer 4. The computer is P4 2.8GHz, two WAT 902H black and white CCD industrial cameras from WATEC, and two from Jiaheng Company. M10A OK series capture card, two domestic GDS 35 lenses, HP vp6315 projector.

[0070] 1) Using a computer to generate three groups of virtual phase-shift gratings with fringe numbers of 120, 116, and 113 respectively, and using a projector to project the gratings onto the object;

[0071] 2) Two CCD cameras collect images and save them in the computer;

[0072] 3) Process the 12 images captured by each camera separately to obtain the phase value of each point;

[0073] 4) In order to make the calculation results more reliable, the modulation degree is used as the basis for...

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Abstract

The invention belongs to the field of 3D contour measurement on object surface. The main technical features comprise: (1) projecting gratings with different frequencies to the object surface to obtain multiple phase diagrams; (2) unwrapping the phase diagrams with frequency synthesis method to obtain high-precision unwrapped phase; (3) matting corresponding points to external polar line with the unwrapped phase and calculating 3D contour of the object surface; and (4) in order to make the calculation result more reliable, using modulation degree as reliable reference of phase unwrapping and masking the phase with modulation degree less than the set threshold. The invention has the advantages of simple structure, non-contact, high precision, high speed, and easy implementation.

Description

[0001] Technical Field 3D Profile Measurement of Object Surface Technical Field Background technique [0002] Using computer vision to measure object contour technology is a research hotspot in 3D measurement at present. It has the advantages of simple structure, non-contact, high speed, high precision and high reliability. It can be widely used in aerospace, machinery manufacturing, medical diagnosis, computer-aided design and manufacturing, reverse engineering design, virtual reality and 3D animation production and other fields. [0003] There are two main technical difficulties in recovering the 3D geometric information of an object from a 2D optical image: First, although the grayscale of an optical image reflects the geometric information of a 3D object, it is not related to many other factors such as the material, texture, and light source of the object. Therefore, restoring the three-dimensional geometric shape of an object from a two-dimensional image is an inverse pro...

Claims

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Application Information

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IPC IPC(8): G01B11/24G01B11/25G01B21/20G06T15/00
Inventor 周波
Owner 北京智启维恩科技开发有限公司
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