Focus detector arrangement for generating phase-contrast X-ray images and method for this
A phase contrast and X-ray technology, which is applied to X-ray equipment, instruments for radiological diagnosis, measuring devices, etc., can solve problems such as poor imaging effect
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[0089] In order to better understand the invention, the basic principle of phase contrast measurement is described below using FIGS. 1 to 3 . For this reason, the following basic explanation is given: All drawings are not standard views, but to list the basic structure and the described effects. The horizontal axis extends relative to the vertical axis (optical axis). The angle is thus shown exaggerated. Although it is the aim of the method to position the analysis gratings when the interference pattern is at its maximum, i.e. at the first Talbot distance, it is possible, in particular, for educational reasons to delineate some of the interferences spatially separated from each other. Graphics and analytics raster. Therefore, the parameters d and r 2 Not only about interference patterns, but also about analyzing gratings.
[0090] FIG. 1 shows coherent radiation from a point-shaped radiation source or approximately coherent radiation generated by a source grating which pas...
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