Random storage failure detection processing method and its system

A random access memory and processing method technology, applied in the detection field, can solve problems that affect product reliability, failure to reproduce, crash, etc., and achieve the effect of saving positioning and analysis workload, reducing impact, and increasing investment

Inactive Publication Date: 2009-09-02
HUAWEI TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Some of them can be found and confirmed to be caused by soft failures through memory analysis, but most of them will manifest as some unreproducible failures, such as reset, crash, and some functional errors without abnormal records, etc.
On the one hand, this will affect the reliability of the product. On the other hand, a lot of manpower will be invested in locating these problems. Therefore, it is necessary to limit the impact of soft failure to a minimum.

Method used

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  • Random storage failure detection processing method and its system
  • Random storage failure detection processing method and its system
  • Random storage failure detection processing method and its system

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Embodiment Construction

[0038] The present invention aims at the program content stored in the CPU / DSP RAM, adopts the method of periodically comparing with the correct data or performing data verification to detect the failure of the RAM memory in time; if there is a failure, start the program to download and repair, Abnormal information reporting, alarm indication and other methods are used to deal with it, so as to minimize the impact of device failure on the system.

[0039] For actual products, CPU / DSP can be divided into two application types according to whether its storage space can be accessed by high-level control entities: one type of CPU / DSP storage space can be accessed by high-level control entities. For the convenience of description, it is referred to as Class A; the storage space of another class of CPU / DSP cannot be accessed by high-level control entities, which is referred to as Class B for short. For the storage space of the two types of CPU / DSP, different detection and disposal m...

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Abstract

The invention discloses a RAM failure detection and processing method, which is applied to the detection and processing of CPU / DSP RAM failure, including: reading the program content in the RAM; if the RAM can be controlled by the high-level of the CPU / DSP Entity access, then compare the program content read with the correct program content by the high-level control entity, when the two are inconsistent, judge that the RAM is invalid and perform data repair; if the RAM cannot be accessed by the high-level CPU / DSP Control entity access, then the program content read by the CPU / DSP is verified by a set verification method, and compared with the correct verification result, when the two are inconsistent, it is judged that the RAM is invalid and Call the police. By adopting the method of the invention, the failure of the CPU / DSP RAM can be detected in time, and corresponding processing measures can be taken in time to minimize the influence caused by the failure of the RAM.

Description

technical field [0001] The invention relates to the field of detection, in particular to a method for detecting and processing the failure of a RAM storage space of a CPU / DSP and a system thereof. Background technique [0002] Devices with random access memory (RAM) will fail due to various reasons during their life cycle. Generally speaking, if the hardware itself is damaged, we call it a device hard failure (Firm Error), otherwise, it is called soft failure of the device (Soft Error). [0003] Soft failure is mainly caused by the impact of charged particles on the memory unit RAM of the device. These high-energy particles interact with the atoms of the semiconductor memory to generate electron-hole pairs, which lead to changes in the information stored in the memory unit, which in turn leads to device function mistake. [0004] At the end of the 1970s, engineers discovered the phenomenon of soft failure. The reason at that time was that the radioactive impurities in the ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/00G06F11/28
Inventor 李强
Owner HUAWEI TECH CO LTD
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