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Device for measuring fluorescence life time

A measurement device and fluorescence lifetime technology, applied in fluorescence/phosphorescence, material excitation analysis, etc., can solve the problems of large volume, high system cost, unfavorable miniaturization and practicality, etc., shorten the fitting time and improve the signal-to-noise ratio Effect

Inactive Publication Date: 2007-02-28
HARBIN ENG UNIV
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The composition of the entire measurement system is very complex (in addition to photoelectric conversion devices and amplifier circuits, there are at least computers and high-speed, high-precision data acquisition cards, etc.), the system cost is high, and the volume is large, which is not conducive to the miniaturization and practical application of this technology.

Method used

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  • Device for measuring fluorescence life time
  • Device for measuring fluorescence life time
  • Device for measuring fluorescence life time

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Embodiment Construction

[0037] Below in conjunction with accompanying drawing, the measuring device of fluorescence lifetime of the present invention is described in further detail:

[0038] Fig. 1 is a schematic diagram of the structure of the present invention based on the fast Fourier transform of the digital processing chip. First, the photodetector is used to receive the fluorescent signal, and the collected fluorescent attenuation signal is amplified and converted to analog-to-digital A / D, and sent to the complex programmable logic device CPLD, and the collected signal is sent to the digital processing chip DSP chip, and the Complete the fast Fourier transform in the processing chip, select the spectral item to obtain the spectrum, obtain the argument angle of the corresponding spectral item, calculate the argument angle or the tangent value of the argument angle of the spectral item, and further use the formula to calculate the fluorescence lifetime corresponding to the decay curve Value, outp...

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Abstract

The invention relates to a tester of fluorescence life time, based on digit processing chip, wherein it uses photoelectric detector to receive fluorescence signal; via signal amplification and A / D conversion, sends signal into digit processing chip, to be treated with quick method of Fourier transformation, to obtain the amplitude angle relative to the frequency one; and uses formula to calculate the fluorescence life time in the processing chip; then outputs or displays the tested life time, or uses it as reference signal to output to other parameters (temperature, etc); then uses asymmetry receiver / sender to output the lift time and other parameters into computer. The invention has high speed, high accuracy, low cost and small volume, while it will not be affected by local noise.

Description

(1) Technical field [0001] The invention relates to a measuring device, in particular to a measuring device for measuring fluorescence lifetime based on fast Fourier transform of a digital processing chip. (2) Background technology [0002] Rare earth element doped substances will emit fluorescence when excited by the pump light, and this fluorescence will decay exponentially after the pump light stops, and the time for the intensity of the fluorescence signal to decay to the original 1 / e is called is the fluorescence lifetime. [0003] The fluorescence lifetime is related to many properties of the substance that emits fluorescence, such as the temperature, humidity, pH value, etc. of the substance. Therefore, measuring the fluorescence lifetime can indirectly measure various physical and chemical parameters. Some people at home and abroad have tried to develop various sensors based on fluorescence lifetime measurement. [0004] For example, fluorescent temperature sensors...

Claims

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Application Information

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IPC IPC(8): G01N21/64
Inventor 孙伟民李海森姜海丽陈宝伟张建中张杨姜富强张志林
Owner HARBIN ENG UNIV
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