Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Mutability analysis in java

A variable and variable technology that can be used in instrumentation, computing, electrical and digital data processing, etc., and can solve security problems and other issues

Inactive Publication Date: 2006-03-29
INT BUSINESS MASCH CORP
View PDF0 Cites 16 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The result is that an unprivileged applet can impersonate a trusted signature, causing serious security problems

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Mutability analysis in java
  • Mutability analysis in java
  • Mutability analysis in java

Examples

Experimental program
Comparison scheme
Effect test

example 1

[0074] Example 1 public class Sample{

[0075] / **************************************************** ***

[0076] * Fields accessible from outside this component *

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A system and method for detecting the mutability of fields and classes in an arbitrary program component written in an object oriented programming language is disclosed. A variable is considered to be mutable if a new value is stored into it, as well as if any of its reachable variables are mutable. The system and method uses a static analysis algorithm which can be applied to any software component rather than whole programs. The analysis classifies fields and classes as either mutable or immutable. In order to facilitate open-world analysis, the algorithm identifies situations that expose variables to potential modification by code outside the component, as well as situations where variables are modified by the analyzed code. An implementation of the analysis is presented which focuses on detecting mutability of class variables, so as to avoid isolation problems. The implementation incorporates intra- and inter-procedural data-flow analyses and is shown to be highly scalable. Experimental results demonstrate the effectiveness of the algorithms.

Description

field of invention [0001] The present invention relates to the field of object-oriented programming languages ​​for computer programs and, in particular, to detecting the mutability of fields and classes in arbitrary program components. Background of the invention [0002] When introduced in late 1995, the programming language Java took the Internet by storm. The main reason for this is that Java is an interpreted programming language, which basically means that it uses a different compilation / execution paradigm than programming languages ​​such as C or C++. Programs written in a high-level programming language such as C or C++ that can be read, written, and understood by humans need to be translated into machine codes that can be understood by the computer that actually runs the program. That's what the compiled program does. Also, the compiler optimizes the code as it translates it. The end product of compilation is machine code, which by definitio...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F9/45G06F9/44
CPCG06F9/4428G06F8/433G06F9/4488
Inventor L·科维德B·门德尔森S·珀拉特M·比伯斯泰恩
Owner INT BUSINESS MASCH CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com