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Contact component and its manufacture and probe contact assembly using the contact component

A technology for contacting components and contacting components, which is applied to contact components, measuring leads/probes, components of connecting devices, etc., can solve problems such as inconsistent quality, and achieve the effects of low cost, long life and low cost

Inactive Publication Date: 2002-04-17
株式会社鼎新
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0015] In conventional technology, probe cards such as image 3 As shown, are handmade resulting in inconsistent quality

Method used

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  • Contact component and its manufacture and probe contact assembly using the contact component
  • Contact component and its manufacture and probe contact assembly using the contact component
  • Contact component and its manufacture and probe contact assembly using the contact component

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0085] Detailed description of the preferred embodiment

[0086] Figure 5-7 An example of the contact member of the present invention is shown. Each contact member is constituted by a contact substrate 20 and contacts 30 . exist Figure 5 example, each contactor 30 1 Extending substantially in the vertical direction, and being formed: a base, this base is connected to contact substrate 20; A contact point, preferably pointed; A contact spring acts.

[0087] exist Figure 6 example, each contactor 30 2 Extending substantially in the vertical direction, and being formed: a base, is connected with contact substrate 20; A contact point, it is divided into two or more points, and is preferably pointed; And a base and contact point The zigzag part between them acts as a contact spring.

[0088] exist Figure 7 example, each contactor 30 3 Extending substantially in the vertical direction, having a hook shape, and being formed: a base, is connected with con...

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PUM

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Abstract

A method for producing a contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contact substrate and a plurality of contactors. The contactor has a tip portion at one end of the contactor to contact with the contact target, a base portion at another end of the contactor which is inserted in a through hole provided on the contact substrate in such a way that an end of the contactor functions as a contact pad for electrical connection at a surface of the contact substrate, and a spring portion provided between the tip portion and the base portion which produces a contact force when the contactor is pressed against the contact target.

Description

field of invention [0001] The invention relates to a contact member, a production method thereof, and a probe contact assembly using the contact member. More specifically, the present invention relates to a contact member having a large number of contacts in a vertical direction. The invention further relates to a method for producing a large number of contacts on a semiconductor wafer in a horizontal orientation, and removing from the wafer the contacts mounted on a substrate in a vertical orientation to form a contact structure, for example, Contact probe assemblies, probe cards, IC chips, or other contact mechanisms. background of the invention [0002] When testing high-density and high-speed electronic devices such as LSI (Large Scale Integration) and VLSI (Very Large Scale Integration), high-performance contact members such as probe cards having a large number of contacts must be used. In other applications, the contact members may be used in IC p...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26G01R1/067G01R1/073G01R3/00G01R31/28H01L21/00H01L21/302H01L21/66H01L23/485H01R11/18H01R12/00H01R13/24H05K3/20H05K3/40
CPCG01R1/06733H01L2924/01032H01R13/2407H05K3/4015G01R1/07307H01L2924/01046H01L2924/01082H01L2924/01004H01L2924/01045H01R13/2428G01R3/00H01L2924/09701H01L2924/30105H01L2924/01019H01R11/18H01L2924/01029H01L2224/13099H01L2924/01022H01L2924/01027H01L2924/19041H01L2924/01013H01L2924/30107H01L2924/01039H01L2924/01024G01R1/06772H01L2924/3011H01L2924/01068H01L2924/14H01L2924/19042H01L2924/01005H01L2924/01033H01L2924/01006H01L2924/01074H01R12/57H01L2924/01078H01L2924/10253H01L24/10H05K3/20H01L24/13H01L2924/15787H01L2924/15184G01R1/06738H01L2924/12042H01L2224/13H01L2224/05573H01L2224/05568H01L2924/00014H01L2924/00H01L2224/05599G01R1/067
Inventor 周豫余大江罗伯特·爱德华·阿尔达斯西奥多·A·库利
Owner 株式会社鼎新
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