Grouping inspection scheme determination system and method for exponential life type product

Abstract

The invention belongs to the technical field of product quality inspection, and discloses a grouping inspection scheme determination system and method for exponential life type products, and the method comprises the steps: a parameter initialization module obtains a producer risk threshold, a good product average life, a user risk threshold, a poor product average life and the test plan time consumption of each group; the sample number calculation module calculates the total number and the receiving number of the samples based on the initialized parameters; the grouping test module is used for performing inspection tests on the first group of samples and the second group of samples respectively; the result output module determines a total test result of the product based on the inspection test results of the first group of samples and the second group of samples. According to the method, matching product state on-line monitoring equipment is not needed, related test hardware conditions are reduced, the uncertainty of test completion time is eliminated, the test can be completed on time within the planned time, and the risk of a producer and the risk of a user can be controlled within a threshold range like a test method of a related standard.

Description

technical field [0001] The invention belongs to the technical field of product quality inspection, and in particular relates to a system and method for determining a group inspection scheme of an index-life-type product. Background technique [0002] At present, generally speaking, the lifespan of normally used electronic components obeys exponential distribution, such as: printed circuit board plug-ins, electronic components, resistors, capacitors, integrated circuits, etc. In theory, when a product consists of many parts, no matter what the distribution of the life of these parts is, as long as any part of the product fails and is repaired and put into use, after a long period of time, the life of the product is basically an exponential distribution . [0003] At present, in a series of international standards, national standards and military standards, some commonly used test methods for exponential life products are introduced. For example, in GJB899A-2009, the commonl...

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Problems solved by technology

For products whose service life is subject to exponential distribution, the current standard test methods need to be equipped with a certain number of product status online monitoring equipment, and the time to complete the test is also uncertain, and the test completion time and the test represented by the product status online monitoring equipment Hardware conditions are often "you can't have both", which also limits the application of the exponential life test method provided by the relevant standards in actual work

[0005] Through the above analysis, the problems and defects of the existing technology are: the test plan of the existing test plan is long and uncertain, the cost is high, the test hardware conditions are harsh, and it cannot be applied to the lack of test hardware conditions such as lack of product status monitoring equipment. scene

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