Z scanning measurement device and measurement method for measuring nonlinear optical coefficient

Abstract

The invention discloses a z scanning measurement device and method for measuring a nonlinear optical coefficient, and the device comprises a laser transmitting device disposed at one side of an electric displacement platform, and a laser receiving device and a spectrum detection device which are disposed at the other side of the electric displacement platform. The laser emitting device comprises a laser, a first spectroscope, a continuously adjustable attenuation sheet, a first convex lens, a concave lens, a first reflecting mirror, a second reflecting mirror and a second convex lens which are arranged in sequence; the laser receiving device comprises a second spectroscope, a third spectroscope and a third reflector which are arranged in parallel, a diaphragm, a first attenuation piece and a first detector are sequentially arranged behind the second spectroscope, a fourth convex lens, a second attenuation piece and a second detector are sequentially arranged behind the third reflector, and the spectrum detection device comprises a third convex lens and a spectrograph. According to the invention, measurement work of two properties of nonlinear optics and emission spectrum can be completed at one time, time and cost are saved, and noise caused by instability of the laser and the like is reduced.

Description

technical field [0001] The invention relates to the technical field of femtosecond laser scanning, in particular to a z-scan measuring device and a measuring method for measuring nonlinear optical coefficients. Background technique [0002] Since the birth of laser technology, traditional linear optics can no longer meet people's needs. The development of nonlinear optics has broken this dilemma. Nonlinear optics mainly studies the nonlinear phenomena and applications of media under the action of strong coherent light. With the development of nonlinear optics, lasers, all-optical switches, optical microfabrication, nonlinear optical imaging, optical information processing, optical communication and other fields have become research hotspots. Therefore, the search for new materials with strong nonlinear optical effects and fast response has become the focus of research. [0003] Then various nonlinear optical characterization techniques were born. Generally speaking, these ...

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Problems solved by technology

The Z-scan method requires the beam to be Gaussian distributed, therefore, phenome

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