Method and device for quantifying thinking similarity of testers

A technology of testers and quantification methods, which is applied in the field of quantification of testers' thinking similarity, which can solve problems such as complex analysis elements that cannot be quantified by testers and test thinking similarities, and achieve the effect of improving the discovery probability and testing efficiency

Pending Publication Date: 2022-04-22
电信科学技术第十研究所有限公司
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  • Application Information

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Problems solved by technology

[0004] The embodiment of the present invention provides a method and device for quantifying the similarity of testers' thinking to solve the complex analysis elements and the inability to test the similarity of testers' thinking in the prior art due to the separate analysis of each tester's test thinking Quantify and other issues

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  • Method and device for quantifying thinking similarity of testers
  • Method and device for quantifying thinking similarity of testers
  • Method and device for quantifying thinking similarity of testers

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Embodiment Construction

[0043] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0044] It should be noted that like numerals and letters denote similar items in the following figures, therefore, once an item is defined in one figure, it does not require further definition and explanation in subsequent figures.

[0045] figure 1It exemplarily shows the implementation flow chart of a method for quantifying teste...

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Abstract

The invention discloses a method and a device for quantifying thinking similarity of testers, and the method comprises the steps: classifying the first-round defects measured by the testers in the first round, and calculating the defect degree coefficient of the classified first-round defects; calculating an initial test thinking classification metric value of each tester under the corresponding test thinking category; calculating a corrected test thinking classification metric value of each tester under the corresponding test thinking category; calculating a test thinking classification metric value of each tester under the corresponding test thinking category, and calculating a standardized test thinking classification metric value of each tester under the corresponding test thinking category; and calculating a test thinking similarity value among the testers. According to the method, the test technology difference of the testers can be effectively determined, so that the problems of thinking ability improvement of the testers, team combination of different testers, test team cultivation and the like are effectively solved, and the effects of improving the project defect discovery probability and the test efficiency are achieved.

Description

technical field [0001] The invention relates to the technical field of computer software testing, in particular to a method and device for quantifying the thinking similarity of testers. Background technique [0002] In the prior art, when evaluating the thinking similarity of testers based on test defects, it is generally obtained by separately analyzing the testing thinking of each tester. However, the elements of this analysis method are relatively complex and are not easy to be quantified in the actual analysis process. Therefore, the original analysis method cannot quantify the similarity of testers’ testing thinking, and cannot effectively clarify the differences in testers’ testing techniques. It is impossible to solve the problems of improving the thinking ability of testers, combining different testers, and training the test team, which will affect the probability of defect discovery and test efficiency. [0003] It is noted that this section is intended to provide...

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Application Information

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IPC IPC(8): G06F11/36G06K9/62
CPCG06F11/3688G06F18/241
Inventor 闫义刘博朱玲芳
Owner 电信科学技术第十研究所有限公司
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