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Data query method, system and equipment and computer readable storage medium

A data query and metadata technology, applied in the field of data processing, can solve the problems of poor accuracy and large deviation of data query

Pending Publication Date: 2022-04-15
SHENZHEN DAPU MICROELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the approximate value of y corresponding to the x value found in this way has a large deviation from the real value, which makes the accuracy of data query poor

Method used

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  • Data query method, system and equipment and computer readable storage medium
  • Data query method, system and equipment and computer readable storage medium
  • Data query method, system and equipment and computer readable storage medium

Examples

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Embodiment Construction

[0079] The following will clearly and completely describe the technical solutions in the embodiments of the application with reference to the drawings in the embodiments of the application. Apparently, the described embodiments are only some of the embodiments of the application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0080] see figure 1 , figure 1 It is a flowchart of a data query method provided by the embodiment of this application.

[0081] A data query method provided by an embodiment of the present application may include the following steps:

[0082] Step S11: Determine the target function corresponding to the target look-up table and the target look-up table interval.

[0083] In practical applications, the objective function corresponding to the target lookup table and the target look...

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Abstract

The invention discloses a data query method, system and device and a computer readable storage medium. The method comprises the steps of determining a target function and a target lookup table interval corresponding to a target lookup table; segmenting the target table lookup interval to obtain each segmented interval and a corresponding segmented interval point; determining an original first-order linear fitting function corresponding to the target function in each segment interval; determining metadata corresponding to each segment interval point based on the original first-order linear fitting function, and constructing a target lookup table based on the segment interval points and the metadata; obtaining a query request, wherein the query request at least comprises target data; determining a target interval point corresponding to the target data from each segmented interval point recorded in the target lookup table based on the target data; and determining a target query result of the target data based on the target interval point and the corresponding metadata. The metadata recorded in the target lookup table can be closer to the value of the segmentation interval point in the target function, and the data query accuracy is ensured.

Description

technical field [0001] The present application relates to the technical field of data processing, and more specifically, to a data query method, system, device, and computer-readable storage medium. Background technique [0002] For the calculation of current artificial intelligence, such as RNN, CNN and other neural networks, when designing hardware calculators, LUT (Lookup Table, lookup table) is often used to realize the activation function calculation. Specifically, the LUT is divided into several sub-intervals, Save the slope and intercept values ​​of the line connecting the two ends of the corresponding function curve at both ends of the interval, so as to approximate the function value corresponding to the independent variable in the interval. For example, [x0,x1] is one of the sub-intervals, and the corresponding The slope a and the intercept value b of the straight line connecting the two points A and B of A and B; during calculation, when the obtained x value falls...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/17
Inventor 王岩
Owner SHENZHEN DAPU MICROELECTRONICS CO LTD
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