Multi-axis coupling hysteresis prediction method for piezoelectric actuator of atomic force microscope

An atomic force microscope and piezoelectric driver technology, applied in the field of precision manufacturing, can solve problems such as difficult multi-axis coupling hysteresis accurate measurement, and achieve the effect of improving high-speed and high-precision imaging, having versatility, and reducing computational complexity

Pending Publication Date: 2022-03-01
HUAZHONG UNIV OF SCI & TECH
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Problems solved by technology

[0004] Aiming at the above defects or improvement needs of the prior art, the present invention provides a multi-axis coupling hysteresis prediction method for atomic force microscope piezoelectric actuators, thereby solving the technical problem that it is difficult to accurately measure multi-axis coupling hysteresis

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  • Multi-axis coupling hysteresis prediction method for piezoelectric actuator of atomic force microscope
  • Multi-axis coupling hysteresis prediction method for piezoelectric actuator of atomic force microscope
  • Multi-axis coupling hysteresis prediction method for piezoelectric actuator of atomic force microscope

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Embodiment Construction

[0034] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0035] An embodiment of the present invention provides a multi-axis coupling hysteresis prediction method for an atomic force microscope piezoelectric driver, such as figure 1 shown, including:

[0036] S1, inputting a periodic voltage signal to one axis of the piezoelectric driver to collect the displacement of the other axis;

[0037] S2, converting the displacement of the other axis into an...

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Abstract

The invention discloses a multi-axis coupling hysteresis prediction method for a piezoelectric actuator of an atomic force microscope, which comprises the following steps of: acquiring a displacement time sequence generated by coupling of a Y axis of an X axis of a piezoelectric tube scanner of the atomic force microscope, lifting original data to a high-dimensional space by using an observation function and a Koopman operator, expressing a multi-axis coupling nonlinear relationship by using a linear equation, and predicting the hysteresis of the piezoelectric actuator of the atomic force microscope. Wherein a Hank matrix is constructed by utilizing lifting data, modal information of a system is obtained by utilizing two-time dimensionality reduction, and finally, establishment of a multi-axis coupling model is realized. According to the prediction method designed by the invention, multi-axis coupling of the piezoelectric tube scanner of the atomic force microscope can be modeled, multi-axis coupling displacement can be predicted, high-speed and high-precision imaging of the atomic force microscope can be effectively improved in later control, and the method can be popularized in other piezoelectric ceramic driver products.

Description

technical field [0001] The invention belongs to the field of precision manufacturing, and more specifically relates to a method for predicting multi-axis coupling hysteresis of an atomic force microscope piezoelectric driver. Background technique [0002] The atomic force microscope is a nanoscale surface topography measurement equipment, which is widely used in micro-nano measurement imaging and manufacturing, and its scanning imaging effect depends largely on the positioning accuracy of the piezoelectric tube scanner. Due to the unique properties of the piezoelectric material of the piezoelectric tube scanner, there is a complex coupling hysteresis effect between multiple axes, which seriously restricts its image-level scanning imaging and measurement accuracy. [0003] In the traditional piezoelectric tube scanner control method, the multi-axis coupling hysteresis is usually regarded as a disturbance, and a feedback controller such as H ∞ Control, PID control, etc. are e...

Claims

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Application Information

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IPC IPC(8): H02N2/06H02N2/02G06F17/16G01Q60/24
CPCH02N2/062H02N2/028G06F17/16G01Q60/24Y02T90/00
Inventor 张海涛黄翔李秀婷陈智勇王志岳易明磊张逸伦
Owner HUAZHONG UNIV OF SCI & TECH
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