Processing method of ESD (Electro-Static Discharge) device with over-voltage and over-current protection functions

An ESD device, over-current protection technology, applied in the direction of electric solid devices, electrical components, semiconductor devices, etc., can solve the problems of unstable power output quality, damage to devices, etc., to avoid damage to electronic products

Inactive Publication Date: 2022-03-01
SHENZHEN SIPTORY TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] Semiconductor components often encounter EOS (electrical overstress) failures in practical applications, unstable power output quality, various overvoltage and overcurrent noises, and inrush current phenomena in hot plug applications. EOS, components are impacted by peak voltage or peak current in a short period of time, thus damaging the device

Method used

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  • Processing method of ESD (Electro-Static Discharge) device with over-voltage and over-current protection functions
  • Processing method of ESD (Electro-Static Discharge) device with over-voltage and over-current protection functions
  • Processing method of ESD (Electro-Static Discharge) device with over-voltage and over-current protection functions

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Embodiment Construction

[0056] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Apparently, the described embodiments are only some of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without making creative efforts belong to the scope of protection of this application.

[0057]In the description of the present application, it should be understood that the terms "first" and "second" are used for description purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly indicating the quantity of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of said features. In the description of the present application, "plurality" means two or m...

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Abstract

The invention discloses a processing method of an ESD (Electro-Static Discharge) device with overvoltage and overcurrent protection functions, which comprises the following steps of: primarily plastic-packaging and filling a frame, so that two end surfaces of each bonding pad in the frame correspondingly protrude out of two end surfaces of the frame; a fuse for connecting the voltage input electric connection bonding pad and the voltage output electric connection bonding pad is processed between the voltage input electric connection bonding pad and the voltage output electric connection bonding pad; welding and mounting an anti-static chip on the top surface of the grounding bonding pad; the secondary plastic package filling frame forms an electric connection processing layer of the anti-static chip and the voltage output electric connection bonding pad, and the electric connection processing layer is electrically connected with the anti-static chip and the voltage output electric connection bonding pad; and the filling frame is plastically packaged again to form a complete ESD device. According to the processing method of the ESD device with the overvoltage and overcurrent protection functions, the overvoltage and overcurrent dual protection functions are achieved, sensitive electronic products are effectively protected, and the situation that the electronic products are damaged due to overvoltage and overcurrent failures is effectively avoided.

Description

technical field [0001] The application relates to the technical field of electronic components, in particular to an ESD device processing method with overvoltage and overcurrent protection functions. Background technique [0002] Semiconductor components often encounter EOS (electrical overstress) failures in practical applications, unstable power output quality, various overvoltage and overcurrent noises, and inrush current phenomena in hot plug applications. EOS, components are impacted by peak voltage or peak current in a short period of time, thus damaging the device. [0003] How to effectively reduce the EOS failure risk of electronic components, improve the withstand voltage and electric capacity during the application of components, and improve the reliability of products is worth studying. Contents of the invention [0004] In view of this, the present application provides an ESD device processing method with overvoltage and overcurrent protection functions, whic...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L23/62H01L23/60
CPCH01L23/62H01L23/60
Inventor 邵冬冬
Owner SHENZHEN SIPTORY TECH CO LTD
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