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ATE-based C8051F chip online test method

An on-line testing and chip technology, applied in electronic circuit testing, measuring electricity, measuring devices, etc., can solve the problems of poor reliability of testing integrated circuits, low testing efficiency, low cost, etc., to achieve convenient testing operation, improve coverage and test reliability and test efficiency improvement

Pending Publication Date: 2022-02-25
西安太乙电子有限公司
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  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to overcome the above-mentioned shortcoming of prior art, provide a kind of C8051F chip online testing method based on ATE, to solve the problem of low testing efficiency, poor reliability of testing integrated circuits and low cost in the prior art

Method used

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  • ATE-based C8051F chip online test method
  • ATE-based C8051F chip online test method
  • ATE-based C8051F chip online test method

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Embodiment Construction

[0025] The present invention will be described in further detail below in conjunction with accompanying drawing and specific embodiment:

[0026] The present invention uses the JAVA development language to develop software by analyzing the test vectors of ATE equipment, optimizes the software code, and makes it easy for each user to use. It does not need to understand the source code, and only needs to input the HEX file to generate the ATE test vector.

[0027] Analyze the principle and timing of C8051F series chips using a dedicated emulator to download data and codes, and write configuration files (binary files) and data into the internal FLASH storage area of ​​the chip using ATE equipment and chip pins;

[0028] Traditional test scheme and the C8051F chip on-line test method flow process based on ATE that the present invention proposes see figure 1 shown.

[0029] The problem that the present invention solves is:

[0030] 1) Software design: Automatically generate ATE ...

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Abstract

The invention discloses an ATE-based C8051F chip on-line test method, which does not need special downloading software, a simulator and a downloading board, simulates a SILICON simulator downloading time sequence by using the ATE, directly writes checkerboard data and a binary code of function configuration into a storage area in a chip, and performs a function module verification test on the ATE after loading. The method has the advantages that the testing time is greatly shortened, meanwhile, the coverage rate and the reliability of C8051F-series chip testing are improved, the quality requirement of testing is ensured, secondary screening of C8051F-series chips is solved, and direct testing economic benefits are generated.

Description

technical field [0001] The invention belongs to the field of chip screening, in particular to an ATE-based online testing method for a C8051F chip. Background technique [0002] The C8051F series single-chip microcomputer is launched by Silicon Labs. It is the microcontroller with the smallest package in the industry. It is also the most complete and the best performance among the 8-bit microcontrollers. The high-speed 20MIPS ~ 25MIPS is fully compatible with the 8051 CIP51 core. Added 64KB flash memory and XRAM, the internal Flash memory can realize in-system programming; through the crossbar switch network, the I / O function can be defined by the user; a large number of SOC-on-chip systems; a complete analog and digital hybrid system. The second screening test of this series of chips has no design vectors from foreign manufacturers. It is necessary to use the special programming software of SILICON to configure the functional modules in C language according to the crossbar ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2851
Inventor 刘娟杜勇
Owner 西安太乙电子有限公司
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