Data enhancement method for insulator defect detection
A defect detection and insulator technology, which is applied in image enhancement, image data processing, instruments, etc., can solve the problems that cannot be applied multiple times, the deviation of real data is large, and the effect of model training is affected, so as to achieve rich feature diversity and context information , the effect of expanding the sample size
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Embodiment 1
[0031] Such as figure 1 As shown, a data augmentation method for insulator defect detection includes the following steps:
[0032] (1) Image cropping and splicing;
[0033] (2) roi extraction-acquire target features, superimpose to the picture after affine transformation;
[0034] (3) Comprehensively apply conventional data enhancement methods such as image flipping, contrast change, and random cropping to the image processed in steps (1) and (2).
[0035] Described step (1) is specifically:
[0036] (1.1) If figure 2 As shown in , the insulators are installed horizontally, divided into several parts along the horizontal direction, and then exchanged with each other, splicing them into a picture of the original size to enrich its context information;
[0037] (1.2) If image 3 As shown in , the insulators are installed vertically, divided into several parts along the vertical direction, and then exchanged with each other, splicing them into a picture of the original size...
Embodiment 2
[0043] A computer storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the above-mentioned data enhancement method for insulator defect detection is realized.
Embodiment 3
[0045] A computer device, comprising a memory, a processor, and a computer program stored on the memory and operable on the processor, when the processor executes the computer program, the above-mentioned data enhancement for insulator defect detection is realized method.
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