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Probe card with different permutations and combinations

An arrangement and combination, probe card technology, applied in the parts of electrical measuring instruments, printed circuit testing, instruments, etc., can solve the problems of complicated circuit detours and difficult to distinguish circuit connection relationships, and achieve clear and easy layout positions. The effect of walking separately and easy to distinguish

Active Publication Date: 2021-12-14
南通芯盟测试研究院运营管理有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The probes on the general probe card are arranged in a circular shape or in a matrix, which has certain limitations on the subsequent lead wire layout, the circuit detour is too complicated, or the line connection relationship is not easy to distinguish

Method used

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  • Probe card with different permutations and combinations
  • Probe card with different permutations and combinations

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0022] The first group and the second group are arranged in the first column, and the third group is arranged in the second column;

[0023] The first group of the first column has one pinhole, and the second group has two vertically arranged pinholes;

[0024] The single group in the second column is the third group, which has four vertically arranged pinholes.

[0025] The number of any group of pinholes or the sum of the numbers of any two groups of pinholes can form a complete sequence of natural numbers: 1, 2, 3, . . . , 7.

[0026] In addition, there are no less than 7 wiring holes on the outside of the second column; each probe hole has a lead wire connected to a wiring hole.

Embodiment 2

[0028] The first group has one pinhole, the second group has two vertically arranged pinholes, the third group has four vertically arranged pinholes, and the fourth group has eight vertically arranged pinholes.

[0029] The first group of the first row has one pinhole, the second group has two vertically arranged pinholes, and the third group has four vertically arranged pinholes;

[0030] The single group in the second column is the fourth group, which has eight vertically arranged pinholes.

[0031] The number of any group of pinholes or the sum of the numbers of any two groups of pinholes can form a complete sequence of natural numbers: 1, 2, 3, . . . , 7, . . . , 15.

[0032] The first column is divided into 3 groups, arranged in order from top to bottom, the first group is a probe hole, the second group is 2 probe holes, the third group is 4 probe holes; the second column is alone as the first 4 sets with 8 probe holes.

[0033] In addition, there are no less than 15 ca...

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PUM

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Abstract

The invention provides a probe card with different permutations and combinations, which is provided with 2N-1 probe holes, the number of the probe holes in the first column is 2N-1-1, the number of the probe holes in the second column is 2N-1, and in addition, the outer side of the second column is provided with no less than 2N-1 flat cable holes; and each probe hole is provided with a lead connected with one flat cable hole. The sum of the number of the probe holes has a complete natural number sequence, and the probe holes and the leads are arranged clearly.

Description

technical field [0001] The invention relates to an arrangement form of probes in a probe card. Background technique [0002] What is a probe? A probe is a test needle used to test PCBs in electronic testing. It is usually gold-plated and is a high-end electronic component. [0003] As an information detection tool, the probe card is a test interface, mainly used for inserting probes, connecting the tester and the chip through the probes, and directly connecting the probes on the probe card to the pads or bumps on the chip. The blocks are in direct contact, and the chip parameters are tested by transmitting signals. The probe card is used before the IC is packaged, and then cooperates with peripheral test equipment and software control to achieve the purpose of automatic measurement. [0004] The probes on a general probe card are arranged in a circular shape or in a matrix, which has certain limitations in the subsequent wiring layout, the circuit detour is too complicated...

Claims

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Application Information

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IPC IPC(8): G01R31/28G01R1/04
CPCG01R31/2801G01R1/0408
Inventor 袁宇锋朱元庆戴莉王建镖
Owner 南通芯盟测试研究院运营管理有限公司
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