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Test probe suitable for large current

A test probe, high current technology, applied in the field of test probes, can solve problems such as overvoltage and limited frequency output, burnout of test probe parts, etc., to reduce current load, prolong service life, and excellent performance Effect

Inactive Publication Date: 2021-11-05
深圳市美锐精密电子有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

During the test process, the requirements for the test probe are extremely high, but the existing probe design has limited output for overvoltage and frequency, and the increase of the voltage will cause the internal parts of the test probe to burn out. Therefore, the present invention proposes a Test probes that can accommodate excessive current to solve the above problems

Method used

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Embodiment Construction

[0020] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, a clear and complete description will be made below in conjunction with the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, and Not all examples. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0021] The test probe adapting to the large current of the preferred embodiment of the present invention, such as Figure 1-2 As shown, including needle tube 1, both ends of needle tube 1 are provided with needle shaft 2, at least one of the two needle shafts 2 is retractable, one of the adjacent ends of the two needle shafts 2 is provided with plug 3, and the other is provided with Cooperate wi...

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Abstract

The invention relates to a test probe suitable for large current. The test probe comprises a probe tube; two ends of the probe tube are provided with probe shafts; at least one of the two probe shafts is arranged in a telescopic manner; one of adjacent ends of the two probe shafts is provided with a plug, the other one is provided with a slot in matched plug connection with the plug; when the plug is inserted into the slot, the parts of the opposite ends of the two probe shafts are located outside the probe tube; and an elastic supporting piece for keeping the plug and the slot in a separated state is arranged between the two probe shafts. The overall structure of the test probe is simple; the defect that a traditional test probe is prone to being burnt out due to the fact that current is too large is overcome; the stability performance effect is excellent in the testing process; and the service life of the test probe is greatly prolonged.

Description

technical field [0001] The invention relates to the technical field of electronic components, in particular to a test probe adaptable to large current. Background technique [0002] The test probe is a high-end precision link device, which is widely used in testing PCB circuit boards and FPC (printed circuits). It is mainly used as a precision probe for connection. It has been widely used in mobile phones, automobiles, medical and aerospace and other technical fields. [0003] When in use, the test probe is installed on the test fixture, one end of the test probe is connected to the output terminal (the output terminal refers to voltage, frequency, etc.), and the other end of the test probe is connected to the component under test before testing can be performed. During the test process, the requirements for the test probe are extremely high, but the existing probe design has limited output for overvoltage and frequency, and the increase of the voltage will cause the intern...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R1/067
CPCG01R31/2806G01R1/06733G01R1/06722
Inventor 龚坚李军
Owner 深圳市美锐精密电子有限公司
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