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Glass particle inspection equipment

A technology for inspecting equipment and glass particles, which is applied in the directions of particle and sedimentation analysis, particle size analysis, measuring devices, etc., and can solve problems such as the drop in inspection accuracy of particle inspection machines

Pending Publication Date: 2021-09-10
山西光兴光电科技有限公司 +2
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a glass particle inspection device to improve the inspection accuracy of glass particles in order to overcome the problem of the drop in inspection accuracy of the particle inspection machine in the prior art

Method used

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  • Glass particle inspection equipment

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Embodiment Construction

[0019] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to illustrate and explain the present invention, not to limit the present invention.

[0020] In the present invention, in the case of no contrary description, the used orientation words such as "up, down, left and right" usually refer to the up, down, left and right shown in the accompanying drawings; "inside and outside" Refers to the inside and outside of the outline of each part itself. Hereinafter, the present application will be described in detail with reference to the accompanying drawings and in combination with embodiments.

[0021] The present application provides a glass particle inspection device, wherein the glass particle inspection device includes a particle inspection machine 10 and a sealing cover 20, the sealing cover 20 is arranged outside the...

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Abstract

The invention relates to the field of glass manufacturing, and discloses glass particle inspection equipment. The glass particle inspection equipment comprises a particle inspection machine (10) and a sealing cover (20), the sealing cover (20) covers the particle inspection machine (10), and the sealing cover (20) comprises an opening capable of being opened and closed to allow glass to enter and exit from the sealing cover (20). The sealing cover can seal and cover the particle inspection machine, so that the area around the particle inspection machine is in a relatively closed and stable state, the influence of the surrounding environment and the fluctuation of the surrounding environment on the detection precision of the particle inspection machine can be remarkably eliminated, and the glass particle inspection precision is improved.

Description

technical field [0001] The invention relates to the field of glass manufacturing, in particular to glass particle inspection equipment. Background technique [0002] In the production of OLED glass, it is necessary to use the dark field reflection detection principle to check the particle condition of the cleaned glass surface through the particle inspection machine. Specifically, the particle inspection machine obliquely shoots the light source onto the glass, captures the scattered light of the particle on the light source through the camera, calculates the size of the particle according to the intensity of the scattered light, and displays the inspection result graphically. During the detection process, the particle detection camera is placed in a dark field, and the captured image is completely black when there is no particle scattered light. When there are particles, due to the existence of scattered light, there will be white bright spots. Calculate according to the br...

Claims

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Application Information

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IPC IPC(8): G01N15/02
CPCG01N15/0211G01N15/0272
Inventor 李青李赫然王赛王俊明赵玉乐张志刚刘东阳薛文明周鹏
Owner 山西光兴光电科技有限公司
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