SystemVerilog coverage set generation method and device
A technology covering sets and excel, applied in special data processing applications, instruments, electrical and digital data processing, etc., can solve problems such as low efficiency and large workload, and achieve the effect of improving efficiency, avoiding low efficiency and avoiding large workload.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0043] figure 1 A flowchart of a SYSTEMVERILOG overlay set is provided by an embodiment of the present invention, which can be performed by the Systemverilog overlay set generating device provided by the embodiment of the present invention. refer to figure 1 This method can include the following steps:
[0044] S101, based on preset, written to the collection of functional test points in the Excel document according to the preset rules;
[0045] It should be noted that in the present application providing, verify that workers need to quantify the function point in the Excel documentation to be quantified by: functional test points. Of course, in the process of writing the relevant information of the function test point, you need to follow the pre-set rules. Because the syntax is a single, and the syntax is compared, and the law can be followed, the verification engineer can make the verification engineer fill in the function test point that needs to be collected by the friendly i...
PUM

Abstract
Description
Claims
Application Information

- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com