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Cryo-electron microscope sample transfer system, method, electronic equipment

A cryo-electron microscope and sample transfer technology, applied in the field of scanning electron microscope, can solve the problems of difficult collision instruments, cryo-electron microscope sample structure, change in properties, instability of the transfer table, drop and docking, etc., to achieve a reliable transfer environment, overcome instability and drop The effect of the structure that prevents the sample from heating up and collides with the instrument with difficulty in docking

Active Publication Date: 2021-09-24
INST OF GEOLOGY & GEOPHYSICS CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In order to solve the above problems, that is, in order to solve the problem that the structure and properties of the cryo-electron microscope sample change during the transfer process, and at the same time overcome the problems of the transfer table in the prior art that are unstable and fall during the transfer process, and the docking is difficult and collides with the instrument, the present invention provides a Cryo-electron microscope sample transfer system, method, electronic equipment

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  • Cryo-electron microscope sample transfer system, method, electronic equipment
  • Cryo-electron microscope sample transfer system, method, electronic equipment
  • Cryo-electron microscope sample transfer system, method, electronic equipment

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Embodiment Construction

[0055] In order to make the embodiments, technical solutions and advantages of the present invention more obvious, the technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the present invention, not all of them. Example. Those skilled in the art should understand that these embodiments are only used to explain the technical principles of the present invention, and are not intended to limit the protection scope of the present invention.

[0056] The first aspect of the present invention provides a cryo-electron microscope sample transfer system, which is used to transfer the prepared cryo-electron microscope sample from the chamber of the sample preparation device, wherein the inner bottom wall of the chamber is provided with a The installation slot for sample transfer. The system includes a master control center, a sample fix...

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Abstract

The invention belongs to the technical field of scanning electron microscopy, and specifically relates to a cryo-electron microscope sample transfer system, method, and electronic equipment, aiming to solve the problem that the cryo-electron microscope sample changes during the transfer process; the system includes a master control center, a transfer table base, a transfer device, transmission rod, moving device, rotating device and vacuum docking mechanism; The second power device and the second transmission assembly; the moving assembly composed of the moving slider, the limit slider and the transmission rod moves to the transmission rod and connects with the transfer device, and the limit slider is locked with the second transmission assembly; the transmission rod, the limit slider The rotary assembly composed of the position slider and the second transmission assembly is rotated until the transmission rod is locked with the transfer device; the transfer device and the moving assembly are moved to the vacuum docking mechanism; the invention effectively prevents the structure and properties of the sample from changing during the transfer process.

Description

technical field [0001] The invention belongs to the technical field of scanning electron microscopes, and in particular relates to a cryo-electron microscope sample transfer system, method and electronic equipment. Background technique [0002] The sample room of the conventional scanning electron microscope is a high vacuum environment, which requires the observation sample to be dry and non-volatile. However, many samples contain water, oil or are volatile, so they cannot meet the conditions of the conventional electron microscope. At the same time, the loss of water and oil will also cause sample structure, The nature changes and the test data is distorted. The cryo-scanning electron microscope developed in recent years makes it possible to observe natural gas hydrates, oil-bearing rocks, biological cells, suspensions, hydrogels and other water-containing and oil-containing samples that cannot be observed by conventional electron microscopes with the help of ultra-low tem...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/2204G01N23/2251H01J37/28
CPCG01N23/2204G01N23/2251H01J37/28H01J2237/204
Inventor 杜忠明杨继进董文杰
Owner INST OF GEOLOGY & GEOPHYSICS CHINESE ACAD OF SCI
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