Test joint debugging method and device based on block chain

A blockchain and joint debugging technology, applied in the blockchain field, can solve problems that cannot be solved in time, long joint debugging time, unclear product positioning, etc., to achieve the effect of improving efficiency, problem solving rate, and ensuring transparency

Pending Publication Date: 2021-07-09
BANK OF CHINA
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  • Abstract
  • Description
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Problems solved by technology

[0004] The embodiment of the present invention provides a block chain-based test joint debugging method to solve various problems encountered in the joint debugging of products in the prior art, resulting in unsuccessful joint debugging, and after encountering problems, each Product positioning is not clear, resulting in problems that cannot be solved in time, resulting in long joint debugging time and poor technical problems. The method includes:
[0007] The em

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  • Test joint debugging method and device based on block chain
  • Test joint debugging method and device based on block chain
  • Test joint debugging method and device based on block chain

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Embodiment Construction

[0029] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention more clear, the embodiments of the present invention will be further described in detail below in conjunction with the accompanying drawings. Here, the exemplary embodiments and descriptions of the present invention are used to explain the present invention, but not to limit the present invention.

[0030] At present, after the development of the task is completed, it is necessary to carry out test joint debugging, but each product will encounter various problems during joint debugging, resulting in unsuccessful joint debugging, and after encountering problems, the positioning of each product is unclear, resulting in problems that cannot be solved in time , so the joint debugging time is too long and the effect is not good.

[0031] In view of the above shortcomings, the present invention proposes a block chain-based functional test environment joint debugging me...

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Abstract

The invention discloses a test joint debugging method and device based on a block chain, and relates to the technical field of block chains, and the method comprises the steps of storing the information of products needing to be subjected to test joint debugging and the development information of the products into the block chain, and enabling all the products to correspond to each other through a link diagram; after the environment joint debugging is started, analyzing the development information of the product, if the product is not developed, judging the influence degree of the product on other products, and if the influence degree exceeds a preset threshold value, pausing test joint debugging; and if the influence degree does not exceed the preset threshold value, performing test joint debugging on the developed product. The test joint debugging efficiency and the problem solving rate can be improved through the block chain.

Description

technical field [0001] The invention relates to the technical field of block chains, in particular to a method and device for joint testing and debugging based on block chains. Background technique [0002] This section is intended to provide a background or context to embodiments of the invention that are recited in the claims. The descriptions herein are not admitted to be prior art by inclusion in this section. [0003] At present, after the development of the task is completed, it is necessary to carry out test joint debugging, but each product will encounter various problems during joint debugging, resulting in unsuccessful joint debugging, and after encountering problems, the positioning of each product is unclear, resulting in problems that cannot be solved in time , so the joint debugging time is too long and the effect is not good. Contents of the invention [0004] The embodiment of the present invention provides a block chain-based test joint debugging method ...

Claims

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Application Information

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IPC IPC(8): G06Q10/04G06Q10/06G06N3/08G06N3/12
CPCG06N3/084G06N3/126G06Q10/04G06Q10/0635
Inventor 党娜李昊刘洋
Owner BANK OF CHINA
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