Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Static correction method for improving small-amplitude structure prediction precision for complex surface structure

A technology with complex surface and prediction accuracy, which is applied in the field of geological exploration to achieve the effect of improving the quality of seismic data and improving prediction accuracy

Pending Publication Date: 2021-07-09
中国煤炭地质总局地球物理勘探研究院
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] Based on the description of the background technology, it is necessary for the present invention to improve the processing quality of seismic data and effectively implement the low-amplitude structural characteristics of the low-velocity zone with large thickness and severe lateral velocity variation. Calibration Method of Prediction Accuracy of Amplitude Structure

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Static correction method for improving small-amplitude structure prediction precision for complex surface structure
  • Static correction method for improving small-amplitude structure prediction precision for complex surface structure
  • Static correction method for improving small-amplitude structure prediction precision for complex surface structure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0029] In order to make the technical method, characteristics and effects of the present invention easier to understand, the present invention will be further described below in conjunction with specific application examples.

[0030] First, pick the first arrival time of the harness, such as figure 1 As shown in the fine picking diagram, ensure that each red pick-up value is at the first arrival time, and effectively use the first-arrival information at the near-offset distance; immediately after the pick-up is completed, perform tomographic inversion to check the pick-up effect and check whether there are flying spots , shortcomings, so as to ensure the accuracy of picking up the first arrival.

[0031] After all the first arrival times are picked up, the first arrivals of the whole work area are merged, and the overall inversion of the whole work area is carried out to obtain the static correction values ​​of the shot points and receiver points in the whole work area; then,...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a static correction method for improving small-amplitude structure prediction precision for a complex surface structure, and the method comprises the following steps: S1, the fine first arrival time pickup of data in a whole work area is carried out, and the three-dimensional grid refraction tomography static correction is carried out in combination with micro-logging interpretation data, a fine near-surface velocity model and low-speed-reduction-zone thickness distribution are obtained through inversion; S2, after a micro-logging constraint tomography inversion near-surface velocity model is obtained, static correction value calculation is carried out, and medium and long wavelength static correction which is not completely solved can be corrected; s3, after the static correction value is applied, earth surface consistency reflected wave residual static correction is carried out, and the static correction problem of the work area can be fully solved.

Description

technical field [0001] The invention belongs to the technical field of geological exploration, and in particular relates to a static correction method for improving the precision of small-scale structure prediction for complex surface structures. Background technique [0002] The complex surface is mainly characterized by mountains, gravel, loess, Gobi, and desert. The terrain undulates violently, and the near-surface conditions are complex, which will cause serious deformation of the first arrival, which is jagged, and the reflection event is seriously distorted, which deviates from the normal hyperbola. Serious static correction problems, such as the shape, the balanced stacking of original data, and basically no imaging, make static correction one of the key factors affecting the processing effect of seismic data in these areas. For complex surface structures, it is necessary to improve the prediction accuracy of small-scale structures. At present, the relatively mature m...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01V1/36
CPCG01V1/362G01V2210/53
Inventor 李文花郎玉泉
Owner 中国煤炭地质总局地球物理勘探研究院
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com