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An X-ray grating interferometer imaging method based on Hough transform method

A Hough transform method and grating interference technology, applied in the field of X-ray imaging, can solve the problems of limited popularization and application, inability to effectively suppress, inability to accurately extract absorption signals, refraction signals and scattering signals, etc., to eliminate inaccuracies, Accurately extracted effects

Active Publication Date: 2022-05-10
HEFEI UNIV OF TECH
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  • Description
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Problems solved by technology

However, the projection images collected in experiments always inevitably contain certain pulse noise or detector saturation noise.
The statistical behavior of these noises does not obey the Gaussian distribution, so the phase stepping method cannot effectively suppress these noises
When there is significant pulse noise or detector saturation noise in the projection image, the phase stepping method cannot accurately extract the absorption signal, refraction signal and scattering signal of the imaged object
This limits the popularization and application of the X-ray grating interferometer imaging method in public security inspection, industrial non-destructive testing and other fields.

Method used

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  • An X-ray grating interferometer imaging method based on Hough transform method
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  • An X-ray grating interferometer imaging method based on Hough transform method

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Embodiment Construction

[0070] In this example, see figure 1 , setting an X-ray grating interferometer consisting of an X-ray source 1, a phase modulation grating 2, an absorption analysis grating 3 and an image detector 4; figure 1 As shown, the position point of the X-ray source 1 is taken as the origin O of the coordinate system, the direction of the ray axis is the Z-axis, and the direction of the grating structure perpendicular to the ray axis and parallel to the phase modulation grating 2 is the Y-axis. The grid line structure direction perpendicular to the ray axis and the phase modulation grating 2 is the X axis, and a rectangular coordinate system O-XYZ is established;

[0071] An X-ray source 1, a phase modulation grating 2, an absorption analysis grating 3 and an image detector 4 are arranged in sequence along the Z axis; and the X-ray source 1, the phase modulation grating 2, the absorption analysis grating 3 and the image detector 4 are in the Align the center along the Y axis;

[0072...

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Abstract

The invention discloses an X-ray grating interferometer imaging method based on the Hough transform method, which is applied to an X-ray source, a phase modulation grating, an absorption analysis grating, and an image detector which are sequentially arranged along the Z axis. In the ray grating interferometer, the center is aligned along the Y axis; X-rays are incident on the phase modulation grating and are spatially modulated, and the outgoing modulated X-rays are incident on the analysis modulation grating after penetrating the object to be imaged. After the modulation is converted into light intensity changes, it is measured and recorded by the image detector; the projection image recorded by the image detector is processed by the proposed Hough transform method, and the absorption signal, refraction signal and dark field signal of the imaged object can be obtained. The invention can solve the problem of accurate extraction of the absorption, refraction and dark field signals of the imaged object when there are significant pulse noise and detector saturation noise.

Description

technical field [0001] The invention relates to the field of X-ray imaging methods, in particular to an X-ray grating interferometer imaging method based on a Hough transform method. Background technique [0002] After more than ten years of research and application exploration, the X-ray grating interferometer imaging method is expected to develop into a powerful supplement to the existing X-ray imaging technology. In principle, an X-ray grating interferometer uses a phase modulation grating to spatially modulate the phase of incident X-rays. The difference in the spatial distribution of the refractive index inside the object will lead to local distortion of the X-ray spatial modulation. These local distortions are converted by the absorption analysis grating into intensity changes that can be directly measured by the detector. The X-ray grating interferometer has multi-mode imaging capability, and can simultaneously acquire the absorption signal, refraction signal and sc...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/20
CPCG01N23/20G01N23/20075G01N2223/064G01N2223/1016
Inventor 王志立陈恒
Owner HEFEI UNIV OF TECH
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