Intelligent chip screening system and screening method thereof

Abstract

The invention discloses an intelligent chip screening system and a screening method thereof. The intelligent chip screening system comprises a bottom plate, a first conveying belt and a second conveying belt, first supporting frames are fixedly installed at the upper end of the bottom plate, and the first conveying belt is fixedly installed between the first supporting frames. A first baffle is horizontally and fixedly arranged between the first supporting frames, the first baffle is located on the outer side of the first conveying belt, and a second supporting frame is vertically and fixedly arranged at the upper end of the bottom plate. When the intelligent chip screening system is used, a recycling box is arranged at the upper end of a placement seat, screened products fall into the recycling box, the gravity of the recycling box is increased, and therefore the placement seat moves downwards and extrudes first springs, and first movable rods move downwards along first sliding grooves till the placement seat extrudes a first trigger switch downwards to start a prompt lamp, a user can replace the recycling box at the upper end, the specific recycling condition does not need to be observed regularly, and labor is greatly saved.

Description

technical field [0001] The invention relates to the field of chip screening equipment, in particular to an intelligent chip screening system and a screening method thereof. Background technique [0002] Existing smart chips need to be screened after production, and the existing screening machine can only screen for a certain type of defect, resulting in the need to use other types of screening machines to screen again after screening, resulting in a waste of time , reduces the screening efficiency, and the screened chips are collected through the collection box, and whether the collection box is full needs to be manually observed regularly, resulting in more labor-intensive, so a device is urgently needed to solve the above problems. Contents of the invention [0003] The purpose of the present invention is to provide an intelligent chip screening system and screening method thereof, so as to solve the problems raised in the above-mentioned background technology. [0004]...

AI Technical Summary

Problems solved by technology

[0002] Existing smart chips need to be screened after production, and the existing screening machine can only screen for a certain type of defect, resulting in the need to use other types of screening machines to screen again after screening, resulting in a waste of time , reduces the screening efficiency, and the screened chips are collected through the collection box, and whether the collection box is full needs to be manually observed regularly, resulting in more labor-intensive, so a device is urgently needed to solve the above problems

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