Device for testing power-on heating performance of high-power semiconductor device
A heat generation performance and testing device technology, which is applied in the direction of single semiconductor device testing, measuring devices, instruments, etc., can solve problems such as large fluctuations in inlet water temperature, inaccurate test temperature, inaccurate performance testing of high-power semiconductor device IGBT, etc.
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[0039] In addition, if figure 1 As shown, according to an embodiment of the present invention, it also includes a smart display 6 electrically connected to the semiconductor device unit 1, the size of the smart display 6 is not less than 12 inches, and the smart display 6 has internal data processing and data storage. And the test data playback function, the intelligent display screen 6 can display the temperature change curve and temperature data of the IGBT device under different working conditions. The smart display screen 6 has a U disk interface function, and the test record data can be transmitted through the U disk.
[0040] According to the above solution of the present invention, a method for arranging thermocouples for temperature measurement integrated with elastic top pressure is proposed, which effectively ensures good contact between the thermocouples and the surface of the radiator, and greatly improves the accuracy of temperature measurement and the consistency...
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