Index collection method and device

Abstract

The invention discloses an index collection method and device which can be used in the financial field or other technical fields, and the index collection method comprises: carrying out the index data collection of a target application through employing an initial index collection strategy, and obtaining initial index data, wherein the initial index acquisition strategy comprises initial acquisition indexes and an acquisition frequency corresponding to each initial acquisition index; if the initial index data meets a preset matching condition of an abnormal scene, obtaining an abnormal scene index collection strategy corresponding to the abnormal scene, wherein the abnormal scene index collection strategy comprises an abnormal scene collection index and a collection frequency corresponding to each abnormal scene collection index; and adopting the abnormal scene index acquisition strategy to perform index data acquisition on the target application to obtain abnormal scene index data. According to the method and the device, deeper monitoring on the abnormal scene is realized, and attribution of the abnormality of the application is facilitated.

Description

technical field [0001] The invention relates to the monitoring field, in particular to an index collection method and device. Background technique [0002] As a way to determine the state of an application (or system), monitoring is crucial to understanding the running state of the entire application (or system) and ensuring the reliability and stability of the application. At present, localized collection tools are usually used to collect application indicators. This method is often passive and single, and each collection action is based on a remote server API call. Usually, the collection tool can monitor multiple preset indicators of the application at the same time. Although it can detect whether the preset indicators are abnormal, it is difficult to conduct in-depth monitoring of the abnormality when an abnormality occurs, and it is lacking in further processing of abnormal problems. , which is not conducive to abnormal attribution. Therefore, the prior art lacks a pr...

AI Technical Summary

Problems solved by technology

At present, localized collection tools are usually used to collect application indicators. In this way, the collection behavior is often passive and single, and each collection action is based on the remote server API call.

Usually, the collection tool can monitor multiple preset indicators of the application at the same time. Although it can detect whether the preset indicators are abnormal, it is difficult to conduct in-depth monitoring of the abnormality when an abnormality occurs, and it is lacking in further processing of abnormal problems. , which is not conducive to abnormal attribution

Therefore, the existing technology lacks a processing method for in-depth monitoring of abnormal scenarios

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