Method for predicting service life of electron multiplier of cesium atomic clock
An electron multiplier and prediction method technology, which is applied in the direction of single semiconductor device testing, instrumentation, measuring electricity, etc., can solve the problems of short service life, no service life prediction of electron multiplier, and fast decay rate.
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[0025] In this embodiment, a method for predicting the service life of a cesium atomic clock electron multiplier provided by the present invention is adopted, and the data in the falling phase of the operating voltage of the electron multiplier are selected for analysis. The test data time is 1 month, and the test data is drawn as In the figure, the ordinate is the test time T, and the abscissa is the working voltage U. According to the figure, the trend line is fitted to form a linear equation mathematical expression U=0.00003889T-1254.2, and the average daily voltage increase is 0.56 volts / day. According to the operating voltage value U of the electron multiplier entering the falling phase 0 =-1254.2V, and the electron multiplier cut-off operating voltage value U t =-2650V, the difference U between the two d =U t -U 0 =-1396V, it is obtained that the electron multiplier has a service life of T under the output of 50nA r =U d / a = 6.83 years.
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