Multi-frequency-point dielectric constant measuring device based on stepped impedance resonance structure

A measuring device and a dielectric constant technology, which are applied in the field of multi-frequency dielectric constant measuring devices, can solve the problem that the change law of the dielectric constant of materials cannot be obtained, and achieve the effects of simple structure, high test accuracy and low cost

Active Publication Date: 2021-05-11
NANJING UNIV OF POSTS & TELECOMM
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, most of the non-resonant methods for testing the dielectric constant of materials can only measure the dielectric constant

Method used

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  • Multi-frequency-point dielectric constant measuring device based on stepped impedance resonance structure
  • Multi-frequency-point dielectric constant measuring device based on stepped impedance resonance structure

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Embodiment Construction

[0020] Embodiments of the present invention will be disclosed in the following diagrams. For the sake of clarity, many practical details will be described together in the following description. It should be understood, however, that these practical details should not be used to limit the invention. That is, in some embodiments of the invention, these practical details are not necessary. In addition, for the sake of simplifying the drawings, some well-known and commonly used structures and components will be shown in a simple schematic manner in the drawings.

[0021] Such as Figure 1-2 As shown, the present invention is a multi-frequency point permittivity measuring device based on a stepped impedance resonance structure, and the measuring device includes a first dielectric layer D1, a second dielectric layer D2 and a third dielectric layer D3 from top to bottom, The first metal layer M1, the second metal layer M2 and the third metal layer M3 are etched on the lower surface...

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Abstract

The invention relates to a multi-frequency-point dielectric constant measuring device based on a stepped impedance resonance structure. The measuring device comprises a first dielectric layer, a second dielectric layer and a third dielectric layer from top to bottom, and is characterized in that a first metal layer, a second metal layer and a third metal layer are etched on the lower surface of the first dielectric layer, a fourth metal layer is etched on the upper surface of the third dielectric layer, and a cavity filled with a tested material is arranged in the center of the second dielectric layer. According to the invention, signal lines with different widths are utilized to form microstrip lines with different impedances so as to form a stepped impedance resonance structure, the structure can generate a plurality of discrete resonance frequency points in a wide frequency band, and through electromagnetic parameters measured by a vector network analyzer and electromagnetic parameters simulated by electromagnetic simulation software HFSS, the dielectric constant of a measured material in the cavity of the measured solid or liquid or solid powder can be deduced, so that finally the multi-frequency-point dielectric constant measuring device based on the stepped impedance resonance structure is achieved.

Description

technical field [0001] The invention relates to a measuring device, in particular to a multi-frequency-point permittivity measuring device based on a ladder impedance resonance structure. Background technique [0002] The dielectric constant of a material is one of the most critical characteristics in the design of microwave radio frequency devices. However, the dielectric constant of the material will not remain constant with the change of the frequency, and the change of the dielectric constant of the material with the frequency will cause dispersion in the transmission line, resulting in pulse distortion in the ultra-wideband system. Therefore, a good understanding of the properties of broadband dielectric constant materials is required for accurate design of microwave radio frequency devices. [0003] The dielectric constant measurement methods of microwave frequency materials are mainly divided into resonance method and non-resonance method. Among the non-resonant met...

Claims

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Application Information

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IPC IPC(8): G01R27/26
CPCG01R27/2617G01R27/2623Y02D30/70
Inventor 于映樊星叶严静李若舟
Owner NANJING UNIV OF POSTS & TELECOMM
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