Chip detection auxiliary device capable of solving problems of high possibility of burnout and single detection surface

Abstract

The invention relates to the technical field of chip manufacturing, and discloses a chip detection auxiliary device capable of solving problems of high possibility of burnout and a single detection surface. The chip detection auxiliary device comprises a shell; the outer side of the shell is movably connected with a fan; a chip is automatically clamped and fixed; the chip is prevented from moving in a detection process, so that the detection operation is facilitated; the operation condition of fixed operation is utilized to trigger heat dissipation operation and overturning operation, so that the linkage between structures is increased, the operation is convenient, and the automation degree is high; through the effect of the fan, heat dissipation is performed on the chip by utilizing a wind power effect while detection is performed, so that the phenomenon that the chip is burnt out due to heat accumulation generated by long-time operation in the detection process of the chip can be avoided,the chip keeps working normally, and the detection operation is carried out smoothly; and the chip is turned over automatically and intermittently through the combined action of a clamping block, a rotating rod, a non-full gear and a second rotating assembly, so that double-sided detection of the chip is achieved, the detection comprehensiveness of the chip is improved, and the working effect is higher.

Description

technical field [0001] The invention relates to the technical field of chip manufacturing, in particular to a chip detection auxiliary device that solves the problems of easy burnout and single detection surface. Background technique [0002] A chip is a miniature electronic device or component that acts as a carrier for integrated circuits and is installed inside various electronic devices. During the chip manufacturing process, it is necessary to conduct comprehensive tests on the finished chip and various current and voltage tests to determine whether the performance of the chip is up to standard. At present, when testing chips, there are usually staff members who use electrical testing boxes to test them. Due to the small size of the chip, it is very easy to move during the detection process, which affects the detection operation, and when it is double-sided detection, the staff needs to turn it over, the operation is not convenient enough, and the work efficiency is re...

AI Technical Summary

Problems solved by technology

[0005] In order to achieve the above-mentioned purposes of automatic flipping, heat dissipation and convenient operation, the present invention provides the following technical solutions: the chip detection auxiliary device that solves the problems of easy burnout and single detection surface includes, a casing, a fan, a clamp block, a clamp rod, a first rotating rod , second rotary rod, fan gear, third rotary rod, slide plate, rotary column, first rotary assembly, insulating tube, metal slide, rotary rod, partial gear, second rotary assembly

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