SSD BIST test method and device, computer equipment and storage medium

A storage medium and temperature testing technology, which is applied in the field of SSDBIST testing, can solve the problems that abnormal information cannot be collected and recorded in real time, SSDBIST test process log storage and collection, and it is difficult to effectively trace production test information, etc.

Pending Publication Date: 2021-04-20
东莞记忆存储科技有限公司
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  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] The existing SSD BIST equipment is only used for thermostat control, and does not store and collect the SSD BIST test process logs, which leads to the inability to collect and record the abnormal information of the test process in real time, and it is difficult to effectively trace the production test information in production applications

Method used

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  • SSD BIST test method and device, computer equipment and storage medium
  • SSD BIST test method and device, computer equipment and storage medium
  • SSD BIST test method and device, computer equipment and storage medium

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Embodiment Construction

[0027] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0028] It should be understood that when used in this specification and the appended claims, the terms "comprising" and "comprises" indicate the presence of described features, integers, steps, operations, elements and / or components, but do not exclude one or Presence or addition of multiple other features, integers, steps, operations, elements, components and / or collections thereof.

[0029] It should also be understood that the terminology used ...

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PUM

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Abstract

The invention relates to an SSD BIST test method and device, computer equipment and a storage medium. The method comprises the following steps: pre-configuring and setting a test temperature and a BIST test duration; controlling the temperature of the temperature box to rise, electrifying the SSD when the temperature reaches a set test temperature, and starting the test; obtaining SSD BIST test log information in real time, and when the set BIST test duration is reached, stopping the test, and storing the SSD BIST test log information. According to the SSD BIST test method and device, the functions of incubator control and SSD BIST test log collection are integrated and unified, automatic power-on, temperature control, setting and automatic power-off in the SSD BIST test process are achieved, log information in the SSD BIST test process is collected and stored, SSD BIST automatic test is effectively conducted, and meanwhile test logs are collected to facilitate subsequent production data tracing and analysis.

Description

technical field [0001] The present invention relates to the technical field of SSD BIST testing, and more specifically refers to methods, devices, computer equipment and storage media for SSD BIST testing. Background technique [0002] The existing SSD BIST equipment is only used for thermostat control, and does not store and collect the SSD BIST test process logs, which leads to the inability to collect and record the abnormal information of the test process in real time, and it is difficult to effectively trace the production test information in production applications . Contents of the invention [0003] The purpose of the present invention is to overcome the defects of the prior art and provide a method, device, computer equipment and storage medium for SSD BIST testing. [0004] To achieve the above object, the present invention adopts the following technical solutions: [0005] The method of SSD BIST test comprises the following steps: [0006] Pre-configured test...

Claims

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Application Information

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IPC IPC(8): G11C29/12G11C29/14
Inventor 彭李乔赵军委张卫民
Owner 东莞记忆存储科技有限公司
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