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Non-volatile storage life prediction method and device, equipment and medium

A non-volatile storage and life prediction technology, applied in the storage field, can solve the problem of low reliability of remaining life

Inactive Publication Date: 2021-04-02
INSPUR BEIJING ELECTRONICS INFORMATION IND
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Problems solved by technology

[0003] The above-mentioned existing methods for predicting the remaining life of non-volatile storage have high reliability when the failure rate is stable, but when the failure rate increases, that is, when the non-volatile storage is in the consumption failure period of the bathtub curve , with low confidence in the predicted remaining life

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  • Non-volatile storage life prediction method and device, equipment and medium
  • Non-volatile storage life prediction method and device, equipment and medium
  • Non-volatile storage life prediction method and device, equipment and medium

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Embodiment Construction

[0042] The following will clearly and completely describe the technical solutions in the embodiments of the application with reference to the drawings in the embodiments of the application. Apparently, the described embodiments are only some of the embodiments of the application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0043] The current prediction method for the life of non-volatile storage mainly determines the ratio of the consumed life of the non-volatile storage to the used time as the average consumption rate, and then divides the remaining life by the average consumption rate to estimate the remaining life. The above-mentioned existing methods for predicting the remaining life of non-volatile storage have high reliability when the failure rate is stable, but when the failure rate increases, ...

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Abstract

The invention discloses a non-volatile storage life prediction method and device, equipment and a medium. The method comprises the steps of obtaining residual life percentage information of target non-volatile storage within past preset duration; determining a first time consumption sequence corresponding to the target nonvolatile storage based on the residual life percentage information; inputting the first time consumption sequence into a preset prophet model so that the prophet model can output a second time consumption sequence corresponding to the target nonvolatile storage, all data in the second time consumption sequence representing a time prediction value consumed when the residual life percentage changes the preset number each time after indicating the lowest remaining life percentage in the remaining life percentage information ; and determining the remaining life duration of the target nonvolatile storage based on the second time consumption sequence, so that the accuracy of predicting the life of the nonvolatile storage when the failure rate is increased can be improved.

Description

technical field [0001] The present application relates to the field of storage technologies, and in particular to a non-volatile storage life prediction method, device, device, and medium. Background technique [0002] Non-volatile storage has a life limit, and the number of erasing and writing of its storage medium is fixed, that is, when the number of erasing and writing of non-volatile storage reaches the rated value, it is the end of life. A non-volatile memory device is composed of blocks (Block), and the damage of a block conforms to a bathtub curve (Bathtub curve, failure rate curve). The percentage of life consumed by the non-volatile storage can be collected. The current prediction method for the life of non-volatile storage mainly determines the ratio of the consumed life of the non-volatile storage to the used time as the average consumption rate, and then divides the remaining life by the average consumption rate to estimate the remaining life. [0003] The abo...

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Application Information

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IPC IPC(8): G11C29/50G06F3/06
CPCG06F3/0616G06F3/0679G11C29/50
Inventor 曹琪苏楠
Owner INSPUR BEIJING ELECTRONICS INFORMATION IND
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