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Method for testing differential nonlinearity and integral nonlinearity of microcontroller analog-to-digital converter

An analog-to-digital converter and integral nonlinear technology, which can be used in analog/digital conversion calibration/testing, analog/digital conversion, code conversion, etc. Testing and other issues to ensure continuity and integrity, meet performance analysis, and reduce the sampling rate

Pending Publication Date: 2021-03-19
SHANGHAI AISINOCHIP ELECTRONICS TECH
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to provide a test method for differential nonlinearity and integral nonlinearity of a microcontroller analog-to-digital converter, to solve the problem of differential nonlinearity and integral nonlinearity of the built-in analog-to-digital converter when the microcontroller does not have a high-speed external interface The performance of the microcontroller cannot be tested, and when the microcontroller has a high-speed external interface, it is necessary to use expensive instruments to connect the microcontroller and the computer

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  • Method for testing differential nonlinearity and integral nonlinearity of microcontroller analog-to-digital converter
  • Method for testing differential nonlinearity and integral nonlinearity of microcontroller analog-to-digital converter

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Embodiment Construction

[0033] The technical solutions in the embodiments of the present invention will be clearly and completely described and discussed below in conjunction with the accompanying drawings of the present invention. Obviously, what is described here is only a part of the examples of the present invention, not all examples. Based on the present invention All other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0034] In order to facilitate the understanding of the embodiments of the present invention, specific embodiments will be taken as examples for further explanation below in conjunction with the accompanying drawings, and each embodiment does not constitute a limitation to the embodiments of the present invention.

[0035] Such as figure 1 As shown, this embodiment provides a method for testing differential nonlinearity and integral nonlinearity of a microcontroller analog-to-digita...

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Abstract

The invention provides a method for testing differential nonlinearity and integral nonlinearity of a microcontroller analog-to-digital converter. The method comprises the following steps that S1, a signal generator generates a sine wave with a preset frequency as a test signal; S2, a microcontroller samples the test signal by adopting an analog-to-digital conversion sampling frequency at a presetrate; S3, the microcontroller adopts a serial port to send sampling data; S4, a computer terminal receives the sampling data and stores the sampling data as a file; and S5, the computer analyzes the data of the file by adopting a code density histogram method to obtain a test result. According to the invention, a performance test of important parameter differential nonlinearity and integral nonlinearity of a built-in analog-to-digital converter can be completed in a low-cost and convenient manner under the condition that the microcontroller only has a low-speed input / output interface.

Description

technical field [0001] The invention relates to the field of integrated circuits, in particular to a method for testing differential nonlinearity and integral nonlinearity of a microcontroller analog-to-digital converter. Background technique [0002] The microcontroller has a built-in analog-to-digital converter. In order to improve the integration and product competitiveness of the current microcontroller, the analog-to-digital converter is designed inside the microcontroller to expand the application field of the microcontroller and improve product integration. Degree, reduce costs, improve reliability and product competitiveness. [0003] In the prior art, when using the dynamic test method to test the performance of differential nonlinearity and integral nonlinearity of the built-in analog-to-digital converter of the microcontroller, it is necessary to save a large amount of continuous sampling data to the computer terminal, and use the code density histogram method An...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B23/02H03M1/10
CPCG05B23/02H03M1/1071
Inventor 肖晗周玉洁孙坚
Owner SHANGHAI AISINOCHIP ELECTRONICS TECH
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