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Photovoltaic module testing device and testing method

A photovoltaic module and testing device technology, applied in the monitoring of photovoltaic systems, photovoltaic power generation, photovoltaic modules, etc., can solve the problems of inability to accurately evaluate the outdoor PID attenuation of photovoltaic modules, inability to accurately test battery components, and inconvenient installation and disassembly. Achieve the effect of eliminating PID recovery phenomenon, high test efficiency and short time consumption

Active Publication Date: 2021-03-16
LIANYUNGANG SHENZHOU NEW ENERGY
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  • Summary
  • Abstract
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  • Claims
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AI Technical Summary

Problems solved by technology

[0008] At present, the PID test method is to test in an indoor test box or under normal temperature conditions. The test box condition is an accelerated test method that simulates a certain temperature and humidity conditions and applies positive and negative bias voltages. It is all carried out under no light conditions; and because There is no light factor in the test method, and it is impossible to accurately test the battery components that are susceptible to light recovery, so it is impossible to accurately evaluate the outdoor PID attenuation of photovoltaic modules; The bracket is installed on the module, and the bracket is removed after the test is completed to take out the photovoltaic module. The overall installation and disassembly is inconvenient, and it takes a lot of time, and the test efficiency is relatively low.

Method used

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  • Photovoltaic module testing device and testing method
  • Photovoltaic module testing device and testing method
  • Photovoltaic module testing device and testing method

Examples

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Embodiment

[0036] Example: see Figure 1-3 , a test device for photovoltaic modules, including a test box 100 and a control device 200, the test box 100 is used for the temperature and humidity test of the photovoltaic module, and the control device 200 is used to adjust the temperature and humidity of the test box 100, existing A heating and humidifying device is installed in the test box 100, and the control device 200 adopts a PLC controller to adjust the temperature and humidity of the heating and humidifying device through the PLC controller;

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Abstract

The invention discloses a photovoltaic module testing device and testing method. The testing device comprises a testing box body and a control device, the testing box body is used for testing the temperature and the humidity of a photovoltaic module, the control device is used for adjusting the temperature and the humidity of the testing box body, and a light source assembly, a placement assemblyand a detection assembly are further arranged in the testing box body; and a corresponding light source assembly is arranged in the testing box body, a light source can be provided for irradiating thephotovoltaic assembly in the test process, and illumination factors are increased, so that the test accuracy is improved. During testing, the bottom of the photovoltaic module is inserted into a slotin a sliding manner, and during dismounting, the photovoltaic module is directly pulled out, so that the whole photovoltaic module can be mounted and dismounted conveniently and quickly, the consumedtime is shorter, the testing efficiency is higher, the testing method of the testing device is used, and an outdoor environment can be simulated more accurately by introducing an illumination condition. The PID recovery phenomenon caused by illumination is eliminated, and the outdoor PID phenomenon of the photovoltaic module can be tested more truly.

Description

technical field [0001] The invention relates to the field of photovoltaic module production, in particular to a photovoltaic module testing device and a testing method thereof. Background technique [0002] Potential decay (PID) is a common phenomenon in crystalline silicon cells. The PID decay mechanism of PERC double-sided cells is generally recognized as PID-s and PID-p. PID-s occurs on the front side, PID-p occurs on the back side, and PID- The p-polarization effect can be restored under light conditions. [0003] Potential decay (PID) is a common phenomenon in crystalline silicon cells. The PID decay mechanism of PERC double-sided cells is generally recognized as PID-s and PID-p. PID-s occurs on the front side, PID-p occurs on the back side, and PID- The p-polarization effect can be restored under light conditions. [0004] PID-s mechanism: Positively charged sodium ions drift and enter the cell through the SiNy and SiO2 layers, causing stacking and PN junction shunti...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H02S50/15
CPCH02S50/15Y02E10/50
Inventor 孟祥武何涛张昌远王帅肖怀韬欧森张艳飞
Owner LIANYUNGANG SHENZHOU NEW ENERGY
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