Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Index data-based inspection method, device and system

A technology of indicator data and indicators, applied in the computer field, can solve problems such as difficult maintenance of scripts and difficulty in achieving effects, and achieve good versatility

Pending Publication Date: 2021-03-09
GUANGZHOU PINWEI SOFTWARE
View PDF0 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the complexity of the system continues to increase and the fineness of monitoring indicators continues to increase, these scripts will become difficult to maintain and achieve ideal results

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Index data-based inspection method, device and system
  • Index data-based inspection method, device and system
  • Index data-based inspection method, device and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0051]An embodiment of the present application provides an index data-based inspection method, and the method is applied to an index data-based inspection device as an example. The device can be configured in any computer device, so that the computer device can Execute the inspection method based on the indicator data.

[0052] Such as figure 1 As shown, the above methods include:

[0053] S11. Obtain a pre-configured inspection template;

[0054] S12. Analyzing the inspection template to obtain an index query statement group including an inspection object instance identifier, wherein the index query statement group includes a plurality of index query statements;

[0055] The inspection template can specify the identifier representing the inspection object instance and a set of index query statement groups for the inspection object instance. For example, the inspection template specifies the identifier 123 representing component A, and the inspection template uses the index ...

Embodiment 2

[0081] Corresponding to the above method, the embodiment of the present application provides an inspection device based on index data, such as figure 2 As shown, the device includes:

[0082] The first acquiring unit 21 is configured to acquire a pre-configured inspection template;

[0083] The parsing unit 22 is configured to parse the inspection template to obtain an index query statement group including inspection object instances, wherein the index query statement group includes multiple index query statements;

[0084] The inspection template can specify the identifier representing the inspection object instance and a set of index query statement groups for the inspection object instance. For example, the inspection template specifies the identifier 123 representing component A, and the inspection template uses the index query statement The group inspects component A and specifies the identifier 132 representing group B. The inspection template uses the index query stat...

Embodiment 3

[0102] Corresponding to the above method and device, Embodiment 3 of the present application provides a computer system, including:

[0103] one or more processors; and

[0104] A memory associated with the one or more processors, the memory is used to store program instructions, and when the program instructions are read and executed by the one or more processors, the method steps of Embodiment 1 are executed, such as Do the following:

[0105] Obtain pre-configured inspection templates;

[0106] Analyzing the inspection template to obtain an index query statement group that includes an inspection object instance, wherein the index query statement group includes multiple index query statements;

[0107] Using the index query statement group to obtain the index data of each index of the inspection object instance stored within the target time range;

[0108] Acquire corresponding pre-trained anomaly detection algorithms and parameters thereof according to the respective indic...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The embodiment of the invention discloses an index data-based inspection method, device and system, and the method comprises the steps: obtaining a pre-configured inspection template, and analyzing the inspection template to obtain an index query statement group comprising an inspection object instance identifier; utilizing the index query statement group to obtain index data of each index of an inspection object instance stored in a target time range; respectively obtaining a corresponding pre-trained anomaly detection algorithm and parameters thereof according to each index; and calculatingthe index data of the corresponding indexes by using the anomaly detection algorithm and the parameters of the anomaly detection algorithm to obtain abnormal data points of the indexes in a target time range. Compared with the prior art, the routing inspection template can meet routing inspection of multiple sets of applications or components of the same type, an independent script does not need to be written for each application or component, and the routing inspection template has good universality.

Description

technical field [0001] The present application relates to the field of computer technology, and in particular to a method, device and system for inspection based on index data. Background technique [0002] With the continuous development of Internet technology, the technical systems of large Internet companies are getting larger and larger, with complex internal structures and numerous components. To ensure the stable operation of each system as a whole, there must be a complete monitoring system. Conventional monitoring methods include data display and alarms such as logs, indicators, and call chains. [0003] In terms of indicator monitoring, due to reasons such as configuration complexity and data size, usually only some of the most important indicators can be monitored, and it cannot cover all aspects of a large number of systems or components. Therefore, other methods that can provide more comprehensive and granular monitoring are needed to supplement. Regularly ins...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F11/07G06Q10/00
CPCG06F11/0751G06F11/0775G06Q10/20
Inventor 潘卫华肖桦李汀川
Owner GUANGZHOU PINWEI SOFTWARE
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com