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A kind of semiconductor structure preparation method and semiconductor device

A technology of semiconductors and precursors, applied in the field of microelectronics, which can solve problems such as unexisting, extremely high process temperature requirements, and complexity

Active Publication Date: 2022-02-08
NANJING UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, at present, three-dimensional complementary devices are mainly prepared by N-type transistors on top of P-type transistors. This process not only requires extremely high temperature for subsequent processes, but also is relatively complicated.
This problem can be solved if nanowires with different doping types can be integrated simultaneously in three dimensions, but no such technology has been disclosed so far.

Method used

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  • A kind of semiconductor structure preparation method and semiconductor device
  • A kind of semiconductor structure preparation method and semiconductor device
  • A kind of semiconductor structure preparation method and semiconductor device

Examples

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Embodiment 1

[0043] This embodiment first provides a method for simultaneously integrating P-type and N-type stacked nanowires in a three-dimensional direction, such as Figure 1a~1i As shown, the method includes at least the following steps:

[0044] The first step is to alternately deposit the first thin film layer 11 and the second thin film layer 12 to form the first base material layer 1; continue to alternately deposit the first thin film layer 11 and the third thin film layer 13 on the first base material layer to form The second base material layer 2 is formed.

[0045] The substrate layer is patterned to expose the first sidewall 100 of the first substrate layer in the stacking direction and the second sidewall 200 of the second substrate layer in the stacking direction. Using SF 6 or C 4 f 8 or CF 4 and other fluorine-containing plasma etching methods, etch downward along the edge of the pattern, etch the first and third film layers except the pattern coverage area, exposing...

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Abstract

The invention discloses a method for preparing a semiconductor structure, which includes the following steps: the first step is to form a first base material layer and a second base material layer, and the first base material layer is composed of alternately deposited first film layers and second film layers Layer composition, the second substrate layer is composed of the first film layer and the third film layer deposited alternately on the first substrate layer, the first film layer is a silicon oxide or silicon nitride film, the The second thin film layer is an intrinsic or P-type amorphous layer, the third thin film layer is an N-type amorphous layer, the first groove is etched on the second thin film layer, and the second groove is etched on the third thin film layer groove.

Description

technical field [0001] The invention relates to a method for preparing a semiconductor structure and a semiconductor device, in particular to a method for simultaneously integrating P-type and N-type stacked nanowires in a three-dimensional direction and a semiconductor device prepared by the method, belonging to the field of microelectronic technology. Background technique [0002] With the continuous miniaturization of devices, the structure of transistors has also changed from a traditional planar structure to a three-dimensional direction. After the 3nm process node, the large distance between P-type transistors and N-type transistors will become the main reason for hindering the further scaling of devices. Using the current partition doping process, the distance between PMOS and NMOS is about 300 nm. If the P-type Transistors and N-type transistors are stacked vertically to form three-dimensional complementary devices, which can break through this bottleneck. However, ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/8238H01L29/06H01L29/10H01L27/092B82Y40/00
CPCH01L21/823807H01L27/092H01L29/1033H01L29/0673B82Y40/00
Inventor 余林蔚胡瑞金王军转
Owner NANJING UNIV
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