Photoelectric coupler high and low temperature test system

A photoelectric coupler and test system technology, which is applied in the direction of environmental/reliability testing, electrical measuring instrument components, instruments, etc., can solve problems such as roughness and weight, and achieve the effects of fewer circuits, avoiding poor contact, and light weight

Pending Publication Date: 2021-01-15
THE 44TH INST OF CHINA ELECTRONICS TECH GROUP CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the large number of lead-out cables, the thicker coaxial cables are overall too thick and heavy, so only thinner single-strand wires with small cross-sections that can only transmit DC signals can be used, resulting in only the DC parameters of the DUT being tested.

Method used

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  • Photoelectric coupler high and low temperature test system
  • Photoelectric coupler high and low temperature test system
  • Photoelectric coupler high and low temperature test system

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Embodiment Construction

[0020] In order for those skilled in the art to better understand the technical solutions in the embodiments of the present invention, and to make the above objects, features, and advantages of the embodiments of the present invention more clearly understood, the following describes the technical solutions in the embodiments of the present invention with reference to the accompanying drawings. for further details.

[0021] In this embodiment, the optocoupler to be tested has five effective pins (effective pins are pins that can produce an effect when the optocoupler works, assuming that the five effective pins of the optocoupler to be tested are respectively 1~ 5 pins), and fifty DUT units 6 are arranged on the high and low temperature test board 1 . Of course, in other embodiments of the present invention, the photocoupler to be tested can also have more than five or less than five effective pins, and the high and low temperature test board 1 can also be provided with more th...

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PUM

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Abstract

The invention discloses a photoelectric coupler high-low temperature test system, which comprises a high and low temperature test board, a high and low temperature box, a control unit and a photoelectric coupler tester; the high and low temperature test board comprises a decoding circuit, a tested piece unit and a signal wire; each tested piece unit comprises a test socket and a solid-state relay;the corresponding output ends of the tested piece units are connected in parallel through signal wiring and then are electrically connected with the test end of the photoelectric coupler tester through a signal cable. According to the invention, pin switching of the to-be-tested photoelectric coupler can be achieved in the high-low temperature test board, the number of cables led out of the high-low temperature box is greatly reduced, the cable connection time during testing is significantly shortened, the operation convenience is improved, the problems of poor contact, open circuit and the like are avoided, and long-term stable work can be achieved; besides, the signal cable adopts a coaxial cable with good alternating current transmission capability, and after impedance matching designis carried out on the connecting wire, alternating current parameters of the photoelectric coupler can be tested.

Description

technical field [0001] The invention relates to the field of photoelectric coupler testing, in particular to a photoelectric coupler high and low temperature testing system. Background technique [0002] For high-reliability optocouplers, it is required to perform parameter tests when the device is at low temperature (such as -55°C) or high temperature (such as 125°C), and the temperature must be pre-heated for a sufficient time (such as 30 minutes), so it is necessary to make A test board that can install several DUTs (that is, photocouplers to be tested) at the same time, put them into a high and low temperature box, and connect the pins of each device (the pins in this article refer to the references that are useful for parameter testing) Pins, empty pins and other useless pins are not included) out of the box and connected to the optocoupler tester for parameter testing. Since the photoelectric coupler tester can only connect to one pin of the DUT at the same time, it i...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/27G01R31/00G01R1/04
CPCG01R1/0408G01R31/003G01R31/27
Inventor 李冰蒋城龚磊鲍江张佳宁王君郝开伟
Owner THE 44TH INST OF CHINA ELECTRONICS TECH GROUP CORP
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