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Broad-Area Optical Photothermal Infrared Spectroscopy

A regional, infrared technology, applied in the field of wide-area optical photothermal infrared spectroscopy, which can solve the problems of increased sampling time, limitations of OPTIR detectors, etc., to achieve the effect of improving measurement throughput

Active Publication Date: 2022-07-05
光热光谱股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the measurement accuracy is proportional to the square root of the sampling time, so increasing the accuracy of an OPTIR detector by increasing the sampling time is limited in practice because, for example, increasing the accuracy by an order of magnitude requires increasing the sampling time by a factor of 100

Method used

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  • Broad-Area Optical Photothermal Infrared Spectroscopy
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Embodiment Construction

[0020] This specification describes methods and apparatus for performing optical photothermal infrared (OPTIR) imaging and spectroscopy with improved sensitivity, improved signal-to-noise ratio, and reduced background signal. By using wide area technology, parallel measurements can be made simultaneously to improve scanning speed and accuracy.

[0021] Several definitions of terms used in this application are provided below.

[0022] "Illumination" refers to direct irradiation of radiation onto an object, such as the surface of a sample. Illumination may include any configuration of radiation sources, pulse generators, modulators, reflective elements, focusing elements, and any other beam control or adjustment elements.

[0023] In the context of light interacting with a sample, the term "interacting" means that the light illuminating the sample is scattered, refracted, absorbed, aberrated, turned, diffracted, transmitted and reflected, transmitted through and / or from the sam...

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Abstract

The present invention describes an apparatus and method for microscopic analysis of a sample by simultaneously characterizing the infrared absorption properties of multiple spatially resolved locations. These devices and methods improve sampling time while collecting microscopic data on sample composition over a wide area.

Description

[0001] priority [0002] Aspects of the embodiments and techniques in this application are described in US Provisional Application Serial No. 62 / 679,588, filed June 1, 2018, the content of which is incorporated herein by reference. technical field [0003] The present invention relates to the study or analysis of materials by using optical means, ie using infrared, visible or ultraviolet light. Background technique [0004] The present invention relates to infrared spectroscopy and imaging with spatial resolution down to the sub-micron scale using optical photothermal detection techniques. Some optical photothermal techniques have been described in US patents, such as patents 9,091,594 and 9,841,324. These references often refer to the technology by different names and abbreviations. For the purposes of this application, in this application, we will collectively refer to these techniques as Optical Photothermal Infrared (OPTIR). [0005] This general area of ​​OPTIR has b...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N1/28G01N21/25G02B6/42G02B21/06G02B27/09G06T11/40H04N5/33
CPCG01N21/171G01N2021/1725G02B21/12G02B21/16G02B21/365G02B21/082C12M21/02C12M41/48C12N1/12G02B21/002G06T7/97H04N23/74H04N23/741C12M29/00C12M29/04C12M29/22C12M33/00C12M39/00C12M41/12C12M41/26C12M41/34C12M41/36C12M41/44G01N21/3563G01N2201/061G01N2201/062G02B21/06G06T2207/10048G06T2207/10056G06T2207/10152
Inventor C·普拉特D·德克尔R·谢蒂
Owner 光热光谱股份有限公司
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