A non-destructive testing method for micro-defects in long-distance thin-plate structures
A thin-plate structure and non-destructive testing technology, applied in the direction of measuring devices, processing detection response signals, instruments, etc., can solve the problems of difficult detection of micro-defects in long-distance thin-plate structures
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[0029] like figure 1 As shown, a non-destructive testing method for long-distance thin plate structure micro-defects includes the following steps:
[0030] A non-destructive testing method for long-distance thin plate structure micro-defects, comprising the following steps:
[0031] Step 1: Determine the geometric dimensions and material properties of the long-distance thin plate to be measured, the positions of the Lamb wave excitation point and observation point on the long-distance thin plate to be measured, and the pre-applied dynamic load at the excitation point. like figure 2 , the geometric dimensions of the long-distance sheet to be measured in this embodiment are: length 180mm, thickness 2mm, elastic modulus E=200GPa, Poisson’s ratio v=0.3, density ρ=7850kg / m 3 , there is a micro-crack-like defect somewhere on the upper part of the long-distance thin plate structure to be measured, but the crack tip position x of the specific crack-like micro-defect cannot be predi...
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