Equipment testability integrated design and evaluation system

Abstract

The invention discloses an equipment testability integrated design and evaluation system, and is suitable for the field of equipment testing. The system comprises a hierarchical modeling function module, wherein the hierarchical modeling function module performs FST modeling; an integrated design and analysis module which performs testability analysis and testability index distribution on equipment in combination with related information of an FST model, wherein a testability analysis result is used for diagnosis strategy generation of a test diagnosis strategy generation module. And a diagnosis strategy result generated by the diagnosis strategy is used for simulation and test of the simulation and physical test module. According to the invention, integrated design, integrated informationintegration and integrated verification evaluation of equipment built-in test and external test equipment can be completed. The hierarchical modeling function module can import an external circuit model for analysis, and then edits the analyzed model to generate an FST model, so that FST modeling is more convenient.

Description

technical field [0001] The invention relates to the field of equipment testing, in particular to an equipment testing integrated design and evaluation system. Background technique [0002] Testability refers to the design characteristics of a product that can accurately determine its status (workable, non-workable, performance degradation) and isolate its internal faults in a timely manner. At present, complex products mainly have the following testability problems: the highly integrated and miniaturized system greatly limits the number of effective test nodes, some external test equipment cannot add enough effective test nodes to the system, and cannot obtain All the necessary test information required for fault diagnosis; the structure and function of the system are more complex, the time required to complete the test is longer, the cost is higher, the test efficiency is reduced, and there are uncertain factors in the test, the fault diagnosis result is not completely reli...

AI Technical Summary

Problems solved by technology

At present, complex products mainly have the following testability problems: the highly integrated and miniaturized system greatly limits the number of effective test nodes, some external test equipment cannot add enough effective test nodes to the system, and cannot obtain All the necessary test information required for fault diagnosis; the structure and function of the system are more complex, the time required to complete the test is longer, the cost is higher, the test efficiency is reduced, and there are uncertain factors in the test, the fault diagnosis result is not completely reliable

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