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Product storage life and reliability evaluation method

A storage life and reliability technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve the problems of difficult evaluation of storage life and reliability

Active Publication Date: 2020-10-30
BEIJING INST OF STRUCTURE & ENVIRONMENT ENG
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Problems solved by technology

[0005] In order to solve the problem that the storage life and reliability of high-reliability and long-life products are difficult to evaluate, the present invention proposes a storage life and reliability evaluation method based on accelerated test data. Accelerated performance degradation test, which clearly reflects the index criterion of product performance in the test, and obtains its accelerated performance degradation data under different accelerated stress levels; secondly, the stochastic Wiener process is used to model the performance degradation of the product accelerated test data, and establish a life prediction model estimation Pseudo-life under accelerated stress; then through the steps of acceleration model determination, life distribution type determination, life-temperature acceleration model establishment, model parameter estimation, etc., evaluate the life index of the product under normal stress level; finally through life distribution fitting calculation Obtain product storage life and reliability evaluation results

Method used

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Embodiment Construction

[0087] In addition to the embodiments described below, the invention can be embodied in other embodiments or carried out in different ways. It is, therefore, to be understood that the invention is not limited to the details of construction of the components described in the following description or shown in the drawings. While only one embodiment is described here, the claims are not limited to that embodiment.

[0088] In order to solve the problem that the storage life and reliability of high-reliability and long-life products are difficult to evaluate, the present invention proposes a storage life and reliability evaluation method based on accelerated test data. Accelerated performance degradation test, which clearly reflects the index criterion of product performance in the test, and obtains its accelerated performance degradation data under different accelerated stress levels; secondly, the stochastic Wiener process is used to model the performance degradation of the prod...

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Abstract

The invention relates to a product storage life and reliability evaluation method. The method comprises: A1, carrying out a product accelerated storage stress test to obtain performance degradation data; A2, performing product performance degradation modeling based on a random wiener process; A3, carrying out life prediction under product acceleration stress based on a random Wiener process; A4, establishing a service life-temperature acceleration model, and estimating parameters of the service life-temperature acceleration model; A5, performing acceleration factor estimation under acceleration stress; A6, performing product life estimation value under normal stress based on acceleration factor conversion; A7, performing product life distribution inspection and distribution parameter estimation are carried out; and A8, carrying out storage life and reliability evaluation.

Description

technical field [0001] The invention belongs to the technical field of life and reliability, and in particular relates to the accelerated life test and life and reliability evaluation technology of equipment. Background technique [0002] With the improvement of equipment life and reliability level, it is difficult to obtain failure data under equipment storage conditions, which makes the traditional life and reliability evaluation model based on failure data difficult to meet the requirements of engineering evaluation. In order to solve such Accelerated test is introduced into the field of life and reliability evaluation. By increasing the environmental stress level of the equipment, carrying out laboratory simulation tests, obtaining accelerated life data, and then using the accelerated model to convert the life of the equipment under normal stress conditions, it has become a solution An important approach to life prediction and reliability assessment problems of high reli...

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Application Information

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IPC IPC(8): G06F30/20G06F119/04G06F119/14
CPCG06F30/20G06F2119/04G06F2119/14Y02P90/30
Inventor 陈志军胡彦平杨璐周芳陈津虎于荣刚唐保强李艳芬牛建朝朱仪凡陈靖怡
Owner BEIJING INST OF STRUCTURE & ENVIRONMENT ENG
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