Product storage life and reliability evaluation method
A storage life and reliability technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve the problems of difficult evaluation of storage life and reliability
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[0087] In addition to the embodiments described below, the invention can be embodied in other embodiments or carried out in different ways. It is, therefore, to be understood that the invention is not limited to the details of construction of the components described in the following description or shown in the drawings. While only one embodiment is described here, the claims are not limited to that embodiment.
[0088] In order to solve the problem that the storage life and reliability of high-reliability and long-life products are difficult to evaluate, the present invention proposes a storage life and reliability evaluation method based on accelerated test data. Accelerated performance degradation test, which clearly reflects the index criterion of product performance in the test, and obtains its accelerated performance degradation data under different accelerated stress levels; secondly, the stochastic Wiener process is used to model the performance degradation of the prod...
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