Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Disk fault prediction method and system

A fault prediction and disk technology, applied in faulty hardware testing methods, faulty computer hardware detection, error detection/correction, etc., can solve the problems of difficult prediction of positive samples and low accuracy of disk fault prediction

Active Publication Date: 2020-10-09
INSPUR SUZHOU INTELLIGENT TECH CO LTD
View PDF1 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The present invention provides a disk failure prediction method and system, aiming to solve the problem that the existing disk failure prediction technology has low prediction accuracy for small sample disk failures and difficult to predict positive samples

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Disk fault prediction method and system
  • Disk fault prediction method and system
  • Disk fault prediction method and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0056] It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0057] The main problems to be solved in the embodiments of the present invention are:

[0058] Because the number of disk failures is often small, the technical challenge of disk failure prediction is very large. System downtime due to disk failure is a rare event. For disk storage systems with small scale or short loading time, the number of failed disks is very small. At the same time, because the disk SMART feature is sparse and the mutation occurs only when the disk is close to failure, most of the SMART feature values ​​related to the failure are zero. Furthermore, the sparsity of SMART features makes it difficult to predict the positive samples corresponding to the faulty disks. Such as Figure 1-A and Figure 1-B As shown, the statistical analysis found that even in the last 7 days of the bad disk, 50%-75% ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a disk fault prediction method and system, and the method comprises the steps: carrying out the sampling and marking of a disk data set through employing the SMART technology,and obtaining a positive sample corresponding to a fault disk and a negative sample corresponding to a normal disk; extracting SMART features of each positive sample and each negative sample accordingto a preset time sequence to obtain time sequence features of each positive sample and each negative sample; importing a self-defined loss function into the extreme gradient boosting XGBoost algorithm to obtain an improved XGBoost algorithm; wherein the loss caused by positive sample misclassification in the user-defined loss function is greater than that caused by negative sample misclassification; and importing the time sequence characteristics as input and the positive sample and the negative sample as output into an improved XGBoost algorithm, so that the improved XGBoost algorithm performs machine learning on the disk data set to obtain a disk fault prediction model. According to the technical scheme, the problems that in the prior art, a positive sample corresponding to the faulty disk is difficult to predict, and the prediction accuracy of the faulty disk is not high can be solved.

Description

technical field [0001] The invention relates to the technical field of intelligent operation and maintenance, in particular to a disk failure prediction method and system. Background technique [0002] In large-scale data centers, the use of hard disks has reached millions of levels. The frequent occurrence of disk failures will lead to a decline in the stability and reliability of the storage system and even the entire IT infrastructure, and even have a negative impact on the business service level agreement. In addition, the disk is also the component with the highest failure rate in the data center. Whether it is abnormal disk read / write speed or data loss, the consequences for any enterprise are very serious. If the disk failure can be predicted in advance before the disk failure occurs, and the possible abnormal disks can be backed up or replaced in time, the loss caused by the disk failure will be greatly reduced, and the operation of the storage system will be greatl...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/2221G06F11/2273
Inventor 王团结梁鑫辉曹琪
Owner INSPUR SUZHOU INTELLIGENT TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products