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Initialization parameter determination method and device of quantum measurement and control system and medium

A technology for initializing parameters and measurement and control systems, which is applied in the computer field and can solve problems such as difficulty in determining the initialization parameters of quantum measurement and control systems.

Pending Publication Date: 2020-10-09
JINAN INSPUR HIGH TECH TECH DEV CO LTD
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Problems solved by technology

[0003] In view of this, the embodiment of the present application provides a method, device and medium for determining the initialization parameters of the quantum measurement and control system, which are used to solve the problem of difficulty in determining the initialization parameters of the quantum measurement and control system in the prior art

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  • Initialization parameter determination method and device of quantum measurement and control system and medium
  • Initialization parameter determination method and device of quantum measurement and control system and medium
  • Initialization parameter determination method and device of quantum measurement and control system and medium

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Embodiment Construction

[0052] In order to make the purpose, technical solution and advantages of the present application clearer, the technical solution of the present application will be clearly and completely described below in conjunction with specific embodiments of the present application and corresponding drawings. Apparently, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0053] The technical solutions provided by various embodiments of the present application will be described in detail below in conjunction with the accompanying drawings.

[0054] figure 1 The flow diagram of a method for determining the initialization parameters of a quantum measurement and control system provided in Embodiment 1 of this specificati...

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Abstract

The embodiment of the invention discloses an initialization parameter determination method and device for a quantum measurement and control system, and a medium. The method comprises the steps: measuring the frequency of a first resonant cavity corresponding to a quantum bit in a quantum chip and first measurement data through the quantum measurement and control system; respectively converting thefrequency of the first resonant cavity and the first measurement data into a first vector and a second vector through a vector conversion module; and inputting the first vector and the second vectorinto a pre-trained initialization parameter setting model, and determining initialization parameters of the quantum measurement and control system. According to the embodiment of the invention, the initialization parameters of the quantum measurement and control system are determined through the initialization parameter determination system, so that the superconducting quantum computer can operatenormally.

Description

technical field [0001] The present application relates to the field of computer technology, and in particular to a method, device and medium for determining initialization parameters of a quantum measurement and control system. Background technique [0002] The core of a superconducting quantum computer is a quantum chip and a quantum measurement and control system. Through the quantum measurement and control system, the designed quantum circuit can be converted into a corresponding quantum control pulse signal, and then the operation of the quantum computer can be controlled. Among them, the initialization phase of the qubit is the basis for the superconducting quantum computer to execute quantum computing applications, during which the initialization parameters of the quantum measurement and control system need to be determined. Due to the involvement of high-precision physical equipment such as quantum measurement and control systems and quantum chips, and the considerati...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F9/445G06F9/4401G06K9/62G01R23/02G01R13/02
CPCG06F9/4406G06F9/44505G01R13/02G01R23/02G06F18/214
Inventor 孙善宝罗清彩于玲金长新刘幼航
Owner JINAN INSPUR HIGH TECH TECH DEV CO LTD
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