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Electronic complete machine storage life continuous evaluation method and device

A technology of storage life and evaluation method, which is applied in the field of storage life evaluation methods and devices of electronic complete machines, and can solve the problems of large storage life evaluation errors and the like

Active Publication Date: 2020-09-04
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Based on this, it is necessary to provide a method and device for evaluating the storage life of an electronic device in view of the problem of large storage life evaluation errors in the traditional product storage life evaluation method

Method used

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  • Electronic complete machine storage life continuous evaluation method and device
  • Electronic complete machine storage life continuous evaluation method and device
  • Electronic complete machine storage life continuous evaluation method and device

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Embodiment Construction

[0075] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar improvements without departing from the connotation of the present invention, so the present invention is not limited by the specific embodiments disclosed below.

[0076] The terms "first" and "second" in this application are only used for descriptive purposes, and should not be understood as indicating or implying relative importance or implicitly specifying the quantity of indicated technical features. Thus, the features defined as "first" and "se...

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Abstract

The invention relates to an electronic complete machine storage life continuous evaluation method and device. According to the electronic complete machine storage life evaluation method, the determination method of the storage life characteristic parameters is clarified by establishing the evaluation model of the electronic complete machine storage life. According to the electronic complete machine storage life evaluation method, a degradation and error back propagation algorithm model is also established, and the model with the minimum error is selected as a storage life prediction model. Andfurther the determined evaluation model of the storage life of the electronic complete machine is combined to obtain the storage life of the electronic complete machine. According to the electronic complete machine storage life evaluation method, a relation model between the storage life characteristic parameters and the storage life and reliability is established, and an important foundation islaid for effectively evaluating the product storage life.

Description

technical field [0001] The present application relates to the technical field of system reliability of electronic products, in particular to a method and device for evaluating the storage life of an electronic complete machine. Background technique [0002] With the rapid development of China's manufacturing industry, the storage life evaluation technology of high reliability and long life electronic products has been widely concerned. Understanding the base life of electronic products is of great significance for formulating product maintenance support strategies, market layout and new product development plans. Research has found that, typically, maintenance costs for a product account for 30% to 70% of its total life cycle cost. Through reasonable research on the product life evaluation strategy and accurate understanding of the product life base, it is possible to reasonably formulate the product warranty period and advance maintenance measures such as intermediate repa...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/27G06N3/04G06N3/08G06F119/02
CPCG06F30/27G06N3/084G06F2119/02G06N3/045Y02P90/30
Inventor 刘小西朱小平杨司邦陆家乐高鸣哲李劲王春辉时钟胡湘洪
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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